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Larsson, Anders
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Publications (10 of 16) Show all publications
Larsson, A., Ingelsson, U., Larsson, E. & Chakrabarty, K. (2010). Study on Combined Test-Data Compression and Test Planning for Testing of Modular SoCs. In: Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus (Ed.), Design and Test Technology for Dependable Systems-on-chip. Information Science Publishing
Open this publication in new window or tab >>Study on Combined Test-Data Compression and Test Planning for Testing of Modular SoCs
2010 (English)In: Design and Test Technology for Dependable Systems-on-chip / [ed] Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, Information Science Publishing , 2010Chapter in book (Other academic)
Abstract [en]

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences.

Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.

Place, publisher, year, edition, pages
Information Science Publishing, 2010
National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-63304 (URN)16-096-0212-9 (ISBN)978-1609-6021-23 (ISBN)
Available from: 2010-12-15 Created: 2010-12-15 Last updated: 2013-04-18Bibliographically approved
Larsson, A., Zhang, X., Larsson, E. & Chakrabarty, K. (2008). Core-Level Expansion of Compressed Test Patterns. In: Proceedings of the Asian Test Symposium: . Paper presented at 17th Asian Test Symposium ATS,2008 (pp. 277-282). Sapporo, JAPAN: IEEE Computer Society
Open this publication in new window or tab >>Core-Level Expansion of Compressed Test Patterns
2008 (English)In: Proceedings of the Asian Test Symposium, Sapporo, JAPAN: IEEE Computer Society , 2008, p. 277-282Conference paper, Published paper (Refereed)
Abstract [en]

 The increasing test-data volumes needed for the testing of system-on-chip (SOC) integrated circuits lead to long test-application times and high tester memory requirements. Efficient test planning and test-data compression are therefore needed. We present an analysis to highlight the fact that the impact of a test-data compression technique on test time and compression ratio are method-dependant as well as TAM-width dependant. This implies that for a given set of compression schemes, there is no compression scheme that is the optimal with respect to test time reduction and test-data compression at all TAM widths. We therefore propose a technique where we integrate core wrapper design, test architecture design and test scheduling with test-data compression technique selection for each core in order to minimize the SOC test-application time and the test-data volume. Experimental results for several SOCs crafted from industrial cores demonstrate that the proposed method leads to significant reduction in test-data volume and test time.

Place, publisher, year, edition, pages
Sapporo, JAPAN: IEEE Computer Society, 2008
Keywords
integrated circuits, system-on-chip, testing, test-data compression, memory requirements, wrapper design, test-application time
National Category
Computer Sciences
Identifiers
urn:nbn:se:liu:diva-43976 (URN)10.1109/ATS.2008.71 (DOI)75283 (Local ID)978-0-7695-3396-4 (ISBN)75283 (Archive number)75283 (OAI)
Conference
17th Asian Test Symposium ATS,2008
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2018-01-12
Davidsson, A., Naidu Sjöswärd, K. & Schmekel, B. (2008). Efficacy of Two Breath Condensers: An in Vitro Comparative Study.
Open this publication in new window or tab >>Efficacy of Two Breath Condensers: An in Vitro Comparative Study
2008 (English)Article in journal (Refereed) Submitted
Abstract [en]

Examination of exhaled breath condensate (EBC) has been suggested to give information about inflammatory airway diseases.

The aim of the present study was to compare efficacy and variability in gain of two commercially available condensers, ECoScreen® [E] and RTube [R] in an in vitro experimental set up.

Methods: Test-fluids containing myeloperoxidase (MPO) or human neutrophil lipocalin (HNL) in addition to saline and bovine serum albumin (BSA) were nebulized. The aerosol was intermittently driven forward by a servoventilator fed by room tempered air, to reach the condenser. Two different concentrations of saline were also dispensed via the same equipment. Analyses of MPO, HNL and chlorine were done by means of ELISA, RIA or a modified adsorbed organic halogen technique (AOX), respectively.

Results: Significantly higher volumes were recovered by ECoScreen than by RTube during 20-minutes experiments (p<0.001) but not in ten-minute experiments (p>0.05). Based on changes of source concentrations in the nebulizer cup, resulting from nebulization per se, recoveries of HNL tended to be higher by E than by R (p<0.05). In contrast there were no significant differences between condensers in recoveries of MPO or chlorine. The spread of data was wide regarding all tested compounds and of similar degree for both condensers, despite acceptable inter-assay coefficients of variations of all analyses.

Conclusion: Condensing efficacy tended to be larger using E than R but there was a large variability in results from both condensers. Individual biomolecules may have their specific characteristics, and this must be taken into consideration when planning studies on EBC. We suggest that further methodological studies of the EBC method are warranted.

Keywords
Chlorine, HNL, MPO, Exhaled Breath Condensate, efficacy
National Category
Medical and Health Sciences
Identifiers
urn:nbn:se:liu:diva-16292 (URN)
Available from: 2009-01-13 Created: 2009-01-13 Last updated: 2009-08-17Bibliographically approved
Larsson, A., Zhang, X., Larsson, E. & Chakrabarty, K. (2008). SOC Test Optimization with Compression-Technique Selection. In: Proceedings - International Test Conference: . Paper presented at A Workshop in Conjunction with the International Test Conference,2008 (pp. 1). IEEE
Open this publication in new window or tab >>SOC Test Optimization with Compression-Technique Selection
2008 (English)In: Proceedings - International Test Conference, IEEE , 2008, p. 1-Conference paper, Published paper (Other academic)
Abstract [en]

The increasing test-data volumes needed for the testing of system-on-chip (SOC) lead to long test times and high memory requirements. We present an analysis to highlight the fact that the impact of a test-data compression technique on test time and compression ratio are method-dependant as well as TAM-width dependant. Therefore, we propose a technique where compression-technique selection is integrated with core wrapper design, test architecture design, and test scheduling to minimize the SOC test time and the test-data volume.

Place, publisher, year, edition, pages
IEEE, 2008
Keywords
systems-on-chip, testing, compression
National Category
Computer Sciences
Identifiers
urn:nbn:se:liu:diva-43982 (URN)10.1109/TEST.2008.4700685 (DOI)75304 (Local ID)978-1-4244-2403-0 (ISBN)978-1-4244-2402-3 (ISBN)75304 (Archive number)75304 (OAI)
Conference
A Workshop in Conjunction with the International Test Conference,2008
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2018-01-12
Larsson, A. (2008). Test Optimization for Core-based System-on-Chip. (Doctoral dissertation). Linköping: Linköping University Electronic Press
Open this publication in new window or tab >>Test Optimization for Core-based System-on-Chip
2008 (English)Doctoral thesis, monograph (Other academic)
Abstract [en]

The semiconductor technology has enabled the fabrication of integrated circuits (ICs), which may include billions of transistors and can contain all necessary electronic circuitry for a complete system, so-called System-on-Chip (SOC). In order to handle design complexity and to meet short time-to-market requirements, it is increasingly common to make use of a modular design approach where an SOC is composed of pre-designed and pre-verified blocks of logic, called cores.

Due to imperfections in the fabrication process, each IC must be individually tested. A major problem is that the cost of test is increasing and is becoming a dominating part of the overall manufacturing cost. The cost of test is strongly related to the increasing test-data volumes, which lead to longer test application times and larger tester memory requirement. For ICs designed in a modular fashion, the high test cost can be addressed by adequate test planning, which includes test-architecture design, test scheduling, test-data compression, and test sharing techniques.

In this thesis, we analyze and explore several design and optimization problems related to core-based SOC test planning. We perform optimization of test sharing and test-data compression. We explore the impact of test compression techniques on test application time and compression ratio. We make use of analysis to explore the optimization of test sharing and test-data compression in conjunction with test-architecture design and test scheduling. Extensive experiments, based on benchmarks and industrial designs, have been performed to demonstrate the significance of our techniques.

Place, publisher, year, edition, pages
Linköping: Linköping University Electronic Press, 2008. p. 189
Series
Linköping Studies in Science and Technology. Dissertations, ISSN 0345-7524 ; 1222
National Category
Computer Sciences
Identifiers
urn:nbn:se:liu:diva-15182 (URN)978-91-7393-768-9 (ISBN)
Public defence
2008-11-12, Visionen, hus B, Campus Valla, Linköpings universitet, Linköping, 13:15 (English)
Opponent
Supervisors
Available from: 2008-10-22 Created: 2008-10-22 Last updated: 2018-01-13Bibliographically approved
Larsson, A., Larsson, E., Chakrabarty, K., Eles, P. I. & Peng, Z. (2008). Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns. In: Design, Automation, and Test in Europe DATE 2008,2008: . Paper presented at Design, Automation, and Test in Europe DATE 2008 (pp. 188). Munich, Germany: IEEE Computer Society Press
Open this publication in new window or tab >>Test-Architecture Optimization and Test Scheduling for SOCs with Core-Level Expansion of Compressed Test Patterns
Show others...
2008 (English)In: Design, Automation, and Test in Europe DATE 2008,2008, Munich, Germany: IEEE Computer Society Press , 2008, p. 188-Conference paper, Published paper (Refereed)
Abstract [en]

The ever-increasing test data volume for core-based system-on-chip (SOC) integrated circuits is resulting in high test times and excessive tester memory requirements. To reduce both test time and test data volume, we propose a technique for test-architecture optimization and test scheduling that is based on core-level expansion of compressed test patterns. For each wrapped embedded core and its decompressor, we show that the test time does not decrease monotonically with the width of test access mechanism (TAM) at the decompressor input. We optimize the wrapper and decompressor designs for each core, as well as the TAM architecture and the test schedule at the SOC level. Experimental results for SOCs crafted from several industrial cores demonstrate that the proposed method leads to significant reduction in test data volume and test time, especially when compared to a method that does not rely on core-level decompression of patterns.

Place, publisher, year, edition, pages
Munich, Germany: IEEE Computer Society Press, 2008
Keywords
testing, system-on-chip, test-architecture optimization, test scheduling, test patterns, compression, test access mechanism, TAM, SOC
National Category
Computer Sciences
Identifiers
urn:nbn:se:liu:diva-39638 (URN)10.1109/DATE.2008.4484684 (DOI)50430 (Local ID)978-3-9810801-3-1 (ISBN)978-3-9810801-4-8 (ISBN)50430 (Archive number)50430 (OAI)
Conference
Design, Automation, and Test in Europe DATE 2008
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2018-01-13
Larsson, A., Ingmarsson, M. & Sun, B. (2007). A Development Platform for Distributed User Interfaces. In: Proceedings of the Nineteenth InternationalConference on Software Engineering & Knowledge Engineering (SEKE’2007). Paper presented at The Nineteenth InternationalConference on Software Engineering & Knowledge Engineering (SEKE’2007), July 9-11, Boston, Massachusetts, USA (pp. 704-704).
Open this publication in new window or tab >>A Development Platform for Distributed User Interfaces
2007 (English)In: Proceedings of the Nineteenth InternationalConference on Software Engineering & Knowledge Engineering (SEKE’2007), 2007, p. 704-704Conference paper, Published paper (Refereed)
Abstract [en]

Developing user interfaces for a heterogeneous environment is a difficult challenge. Partial distribution of the user interface is an event harder one. Specifically providing developers with means of describing and controlling how components move around as devices are included or removed We present an approach to overcome these challenges, by combining ontologies with reasoning engines. Our tool MaDoE uses Protégé in combination with Jess to exemplify this in a simulated home setting. Our approach allows system developers to take advantage of the formal knowledge in the ontologies as well harnessing the power of rules inside the expert system when they design distributed user interfaces.

National Category
Computer and Information Sciences
Identifiers
urn:nbn:se:liu:diva-84252 (URN)1-891706-20-9 (ISBN)
Conference
The Nineteenth InternationalConference on Software Engineering & Knowledge Engineering (SEKE’2007), July 9-11, Boston, Massachusetts, USA
Available from: 2012-10-03 Created: 2012-10-03 Last updated: 2018-01-12Bibliographically approved
Larsson, A., Larsson, E., Eles, P. I. & Peng, Z. (2007). A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing. In: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems,2007: . Paper presented at IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems,2007 (pp. 61). Krakow, Poland: IEEE Computer Society Press
Open this publication in new window or tab >>A Heuristic for Concurrent SOC Test Scheduling with Compression and Sharing
2007 (English)In: IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems,2007, Krakow, Poland: IEEE Computer Society Press , 2007, p. 61-Conference paper, Published paper (Refereed)
Abstract [en]

The increasing cost for System-on-Chip (SOC) testing is mainly due to the huge test data volumes that lead to long test application time and require large automatic test equipment (ATE) memory. Test compression and test sharing have been proposed to reduce the test data volume, while test infrastructure and concurrent test scheduling have been developed to reduce the test application time. In this work we propose an integrated test scheduling and test infrastructure design approach that utilizes both test compression and test sharing as basic mechanisms to reduce test data volumes. In particular, we have developed a heuristic to minimize the test application time, considering different alternatives of test compression and sharing, without violating a given ATE memory constraint. The results from the proposed Tabu Search based heuristic have been validated using benchmark designs and are compared with optimal solutions.

Place, publisher, year, edition, pages
Krakow, Poland: IEEE Computer Society Press, 2007
Keywords
testing, system-on-chip, memory reduction, test scheduling, test data compression, test sharing, tabu search
National Category
Computer Sciences
Identifiers
urn:nbn:se:liu:diva-39300 (URN)10.1109/DDECS.2007.4295255 (DOI)47834 (Local ID)1-4244-1162-9 (ISBN)1-4244-1162-9 (ISBN)47834 (Archive number)47834 (OAI)
Conference
IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems,2007
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2018-01-13
Larsson, A., Larsson, E., Eles, P. I. & Peng, Z. (2007). Optimized Integration of Test Compression and Sharing for SOC Testing. In: Design, Automation, and Test in Europe Conference DATE07,2007: . Paper presented at Design, Automation, and Test in Europe Conference DATE07,2007 (pp. 207). Nice, France: IEEE Computer Society Press
Open this publication in new window or tab >>Optimized Integration of Test Compression and Sharing for SOC Testing
2007 (English)In: Design, Automation, and Test in Europe Conference DATE07,2007, Nice, France: IEEE Computer Society Press , 2007, p. 207-Conference paper, Published paper (Refereed)
Abstract [en]

The increasing test data volume needed to test core-based System-on-Chip contributes to long test application times (TAT) and huge automatic test equipment (ATE) memory requirements. TAT and ATE memory requirement can be reduced by test architecture design, test scheduling, sharing the same tests among several cores, and test data compression. We propose, in contrast to previous work that addresses one or few of the problems, an integrated framework with heuristics for sharing and compression and a Constraint Logic Programming technique for architecture design and test scheduling that minimizes the TAT without violating a given ATE memory constraint. The significance of our approach is demonstrated by experiments with ITC-02 benchmark designs.

Place, publisher, year, edition, pages
Nice, France: IEEE Computer Society Press, 2007
Keywords
testing, system-on-chip, SOC, test scheduling, memory requirements, test data compression, constraint logic programming
National Category
Computer Sciences
Identifiers
urn:nbn:se:liu:diva-35883 (URN)10.1109/DATE.2007.364592 (DOI)28907 (Local ID)978-3-9810801-2-4 (ISBN)28907 (Archive number)28907 (OAI)
Conference
Design, Automation, and Test in Europe Conference DATE07,2007
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2018-01-13
Larsson, A., Larsson, E., Eles, P. I. & Peng, Z. (2005). Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip. In: 8th Euromicro Conference on Digital System Design DSD2005,2005: . Paper presented at 8th Euromicro Conference on Digital System Design DSD2005 (pp. 403). Porto, Portugal: IEEE Computer Society Press
Open this publication in new window or tab >>Optimization of a Bus-based Test Data Transportation Mechanism in System-on-Chip
2005 (English)In: 8th Euromicro Conference on Digital System Design DSD2005,2005, Porto, Portugal: IEEE Computer Society Press , 2005, p. 403-Conference paper, Published paper (Refereed)
Abstract [en]

The increasing amount of test data needed to test SOC (System-on-Chip) entails efficient design of the TAM (test access mechanism), which is used to transport test data inside the chip. Having a powerful TAM will shorten the test time, but it costs large silicon area to implement it. Hence, it is important to have an efficient TAM with minimal required hardware overhead. We propose a technique that makes use of the existing bus structure with additional buffers inserted at each core to allow test application to the cores and test data transportation over the bus to be performed asynchronously. The non-synchronization of test data transportation and test application makes it possible to perform concurrent testing of cores while test data is transported in a sequence. We have implemented a Tabu search based technique to optimize our test architecture, and the experimental results indicate that it produces high quality results at low computational cost.

Place, publisher, year, edition, pages
Porto, Portugal: IEEE Computer Society Press, 2005
Keywords
testing, system-on-chip, test access mechanism, TAM, bus structure, test data transportation
National Category
Computer Sciences
Identifiers
urn:nbn:se:liu:diva-28508 (URN)10.1109/DSD.2005.59 (DOI)13657 (Local ID)0-7695-2433-8 (ISBN)13657 (Archive number)13657 (OAI)
Conference
8th Euromicro Conference on Digital System Design DSD2005
Available from: 2009-10-09 Created: 2009-10-09 Last updated: 2018-01-13
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