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Bao, Min
Publications (9 of 9) Show all publications
Ukhov, I., Bao, M., Eles, P. I. & Peng, Z. (2012). Steady-State Dynamic Temperature Analysis and Reliability Optimization for Embedded Multiprocessor Systems. In: 49th ACM/EDAC/IEEE Design Automation Conference (DAC), 3-7 June 2012, San Francisco: . Paper presented at 49th ACM/EDAC/IEEE Design Automation Conference (DAC), 3-7 June 2012, San Francisco (pp. 197-204). ACM/ IEEE
Open this publication in new window or tab >>Steady-State Dynamic Temperature Analysis and Reliability Optimization for Embedded Multiprocessor Systems
2012 (English)In: 49th ACM/EDAC/IEEE Design Automation Conference (DAC), 3-7 June 2012, San Francisco, ACM/ IEEE , 2012, p. 197-204Conference paper, Published paper (Refereed)
Abstract [en]

In this paper we propose an analytical technique for the steady-state dynamic temperature analysis (SSDTA) of multiprocessor systems with periodic applications. The approach is accurate and, moreover, fast, such that it can be included inside an optimization loop for embedded system design. Using the proposed solution, a temperature-aware reliability optimization, based on the thermal cycling failure mechanism, is presented. The experimental results con firm the quality and speed of our SSDTA technique, compared to the state of the art. They also show that the lifetime of an embedded system can significantly be improved, without sacrificing its energy efficiency, by taking into consideration, during the design stage, the steady-state dynamic temperature profile of the system.

Place, publisher, year, edition, pages
ACM/ IEEE, 2012
Keywords
Multiprocessor System; Periodic Power Profile; Temperature Analysis; Leakage Power; Thermal Cycling Fatigue
National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-87559 (URN)10.1145/2228360.2228399 (DOI)000309256800030 ()978-1-4503-1199-1 (ISBN)
Conference
49th ACM/EDAC/IEEE Design Automation Conference (DAC), 3-7 June 2012, San Francisco
Available from: 2013-01-18 Created: 2013-01-18 Last updated: 2019-01-28
Bao, M., Andrei, A., Ion Eles, P. & Peng, Z. (2012). Temperature-Aware Idle Time Distribution for Leakage Energy Optimization. IEEE Transactions on Very Large Scale Integration (vlsi) Systems, 20(7), 1187-1200
Open this publication in new window or tab >>Temperature-Aware Idle Time Distribution for Leakage Energy Optimization
2012 (English)In: IEEE Transactions on Very Large Scale Integration (vlsi) Systems, ISSN 1063-8210, E-ISSN 1557-9999, Vol. 20, no 7, p. 1187-1200Article in journal (Refereed) Published
Abstract [en]

Large-scale integration with deep sub-micron technologies has led to high power densities and high chip working temperatures. At the same time, leakage energy has become the dominant energy consumption source of circuits due to reduced threshold voltages. Given the close interdependence between temperature and leakage current, temperature has become a major issue to be considered for power-aware system level design techniques. In this paper, we address the issue of leakage energy optimization through temperature aware idle time distribution (ITD). We first propose an offline ITD technique to optimize leakage energy consumption, where only static idle time is distributed. To account for the dynamic slack, we then propose an online ITD technique where both static and dynamic idle time are considered. To improve the efficiency of our ITD techniques, we also propose an analytical temperature analysis approach which is accurate and, yet, sufficiently fast to be used inside the energy optimization loop.

National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-69730 (URN)10.1109/TVLSI.2011.2157542 (DOI)000305181800004 ()
Available from: 2011-08-01 Created: 2011-08-01 Last updated: 2019-01-28
Bao, M., Andrei, A., Eles, P. & Peng, Z. (2011). On-Line Temperature-Aware Idle Time Distribution for Leakage Energy Optimization. In: 6th International Symposium on Electronic Design, Test and Applications (DELTA 2011), Queenstown, New Zealand, January 17-19, 2011.: . Paper presented at DELTA 2011.
Open this publication in new window or tab >>On-Line Temperature-Aware Idle Time Distribution for Leakage Energy Optimization
2011 (English)In: 6th International Symposium on Electronic Design, Test and Applications (DELTA 2011), Queenstown, New Zealand, January 17-19, 2011., 2011Conference paper, Published paper (Refereed)
Abstract [en]

With new technologies, temperature has becomean important issue to be considered at system level design. Inthis paper, we address the issue of leakage energy optimizationthrough temperature aware idle time distribution (ITD). Wepropose an on-line ITD technique for leakage energy consumptionminimization, where both static and dynamic idle timeare considered. Experimental results have demonstrated that animportant amount of leakage energy reduction can be achievedby applying our ITD techniques.

National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-63322 (URN)10.1109/DELTA.2011.36 (DOI)978-1-4244-9357-9 (ISBN)
Conference
DELTA 2011
Available from: 2010-12-15 Created: 2010-12-15 Last updated: 2017-02-14Bibliographically approved
Bao, M. (2010). System-Level Techniques for Temperature-Aware Energy Optimization. (Licentiate dissertation). Linköping University: Linköping University Electronic Press
Open this publication in new window or tab >>System-Level Techniques for Temperature-Aware Energy Optimization
2010 (English)Licentiate thesis, monograph (Other academic)
Abstract [en]

Energy consumption has become one of the main design constraints in today’s integrated circuits. Techniques for energy optimization, from circuit-level up to system-level, have been intensively researched.

The advent of large-scale integration with deep sub-micron technologies has led to both high power densities and high chip working temperatures. At the same time, leakage power is becoming the dominant power consumption source of circuits, due to continuously lowered threshold voltages, as technology scales. In this context, temperature is an important parameter. One aspect, of particular interest for this thesis, is the strong inter-dependency between leakage and temperature. Apart  from leakage power, temperature also has an important impact on circuit delay and, implicitly, on the frequency, mainly through its influence on carrier mobility and threshold voltage. For power-aware design techniques, temperature has become a major factor to be considered. In this thesis, we address the issue of system-level energy optimization for real-time embedded systems taking temperature aspects into consideration.

We have investigated two problems in this thesis: (1) Energy optimization via temperature-aware dynamic voltage/frequency scaling (DVFS). (2) Energy optimization through temperature-aware idle time (or slack) distribution (ITD). For the above two problems, we have proposed off-line techniques where only static slack is considered. To further improve energy efficiency, we have also proposed online techniques, which make use of both static and dynamic slack. Experimental results have demonstrated that considerable improvement of the energy efficiency can be achieved by applying our temperature-aware optimization techniques. Another contribution of this thesis is an analytical temperature analysis approach which is both accurate and sufficiently fast to be used inside an energy optimization loop.

Place, publisher, year, edition, pages
Linköping University: Linköping University Electronic Press, 2010. p. 79
Series
Linköping Studies in Science and Technology. Thesis, ISSN 0280-7971 ; 1459
Keywords
Temperature-Aware Design, Energy Optimization, System-Level Design, Embedded Systems
National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-60855 (URN)978-91-7393-264-6 (ISBN)
Presentation
2010-12-16, Alan Turing, hus E, Campus Valla, Linköping University, Linköping, 13:15 (English)
Opponent
Supervisors
Available from: 2010-12-01 Created: 2010-10-28 Last updated: 2019-01-28Bibliographically approved
Bao, M., Andrei, A., Ion Eles, P. & Peng, Z. (2010). Temperature-aware idle time distribution for energy optimization with dynamic voltage scaling. In: Proceedings -Design, Automation and Test in Europe, DATE: . Paper presented at Design, Automation and Test in Europe Conference and Exhibition, DATE 2010; Dresden; Germany (pp. 21-26). IEEE
Open this publication in new window or tab >>Temperature-aware idle time distribution for energy optimization with dynamic voltage scaling
2010 (English)In: Proceedings -Design, Automation and Test in Europe, DATE, IEEE , 2010, p. 21-26Conference paper, Published paper (Refereed)
Abstract [en]

With new technologies, temperature has become a major issue to be considered at system level design. In this paper we propose a temperature aware idle time distribution technique for energy optimization with dynamic voltage scaling (DVS). A temperature analysis approach is also proposed which is accurate and, yet, sufficiently fast to be used inside the optimization loop for idle time distribution and voltage selection.

Place, publisher, year, edition, pages
IEEE, 2010
Series
Design, Automation, and Test in Europe Conference and Exhibition. Proceedings, ISSN 1530-1591, E-ISSN 1558-1101
National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-59106 (URN)10.1109/DATE.2010.5457241 (DOI)978-3-9810801-6-2 (ISBN)978-1-4244-7054-9 (ISBN)
Conference
Design, Automation and Test in Europe Conference and Exhibition, DATE 2010; Dresden; Germany
Available from: 2010-09-20 Created: 2010-09-09 Last updated: 2019-01-28
Bao, M., Andrei, A., Eles, P. & Peng, Z. (2009). An Energy Efficient Technique for Temperature-Aware Voltage Selection. Linköping: Linköping University Electronic Press
Open this publication in new window or tab >>An Energy Efficient Technique for Temperature-Aware Voltage Selection
2009 (English)Report (Other academic)
Abstract [en]

High power densities in current SoCs result in both huge energy consumption and increased chip temperature. This paper proposes a temperature-aware dynamic voltage selection technique for energy minimization and presents a thorough analysis of the parameters that influence the potential gains that can be expected from such a technique, compared to a voltage selection approach that ignores temperature. In addition to demonstrating the actual percentages of energy that can be saved by being temperature aware, we explore some significant issues in this context, such as the relevance of taking into consideration transient temperature effects at optimization, the impact of the percentage of leakage power relative to the total power consumed and of the degree to which leakage depends on temperature.

Place, publisher, year, edition, pages
Linköping: Linköping University Electronic Press, 2009. p. 7
Series
Technical reports in Computer and Information Science, ISSN 1654-7233 ; 4
National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-58012 (URN)
Available from: 2010-07-16 Created: 2010-07-16 Last updated: 2019-01-28Bibliographically approved
Bao, M., Andrei, A., Eles, P. I. & Peng, Z. (2009). On-line Thermal Aware Dynamic Voltage Scaling for Energy Optimization with Frequency/Temperature Dependency Consideration. In: DAC '09 Proceedings of the 46th Annual Design Automation Conference: . Paper presented at 2009 46th ACM/IEEE Design Automation Conference, DAC 2009; San Francisco, CA; United States (pp. 490-495). IEEE Computer Society
Open this publication in new window or tab >>On-line Thermal Aware Dynamic Voltage Scaling for Energy Optimization with Frequency/Temperature Dependency Consideration
2009 (English)In: DAC '09 Proceedings of the 46th Annual Design Automation Conference, IEEE Computer Society, 2009, p. 490-495Conference paper, Published paper (Refereed)
Abstract [en]

With new technologies, temperature has become a major issue to be considered at system level design. Without taking temperature aspects into consideration, no approach to energy or/and performance optimization will be sufficiently accurate and efficient. In this paper we propose an on-line temperature aware dynamic voltage and frequency scaling (DVFS) technique which is able to exploit both static and dynamic slack. The approach implies an offline temperature aware optimization step and on-line voltage/frequency settings based on temperature sensor readings. Most importantly, the presented approach is aware of the frequency/temperature dependency, by which important additional energy savings are obtained.

Place, publisher, year, edition, pages
IEEE Computer Society, 2009
Series
ACM / IEEE Design Automation Conference. Proceedings, ISSN 0738-100X
Keywords
temperature dependency; energy; voltage/frequency scaling
National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-58242 (URN)10.1145/1629911.1630039 (DOI)000279394200099 ()978-1-60558-497-3 (ISBN)
Conference
2009 46th ACM/IEEE Design Automation Conference, DAC 2009; San Francisco, CA; United States
Available from: 2010-08-10 Created: 2010-08-09 Last updated: 2014-09-05
Bao, M., Andrei, A., Eles, P. I. & Peng, Z. (2008). Temperature-Aware Task Mapping for Energy Optimization with Dynamic Voltage Scaling. In: 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2008. Paper presented at 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2008), 16-18 April 2008, Bratislava, Slovakia (pp. 44-49). IEEE Computer Society
Open this publication in new window or tab >>Temperature-Aware Task Mapping for Energy Optimization with Dynamic Voltage Scaling
2008 (English)In: 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, 2008, IEEE Computer Society, 2008, p. 44-49Conference paper, Published paper (Refereed)
Abstract [en]

Temperature has become an important issue in nowadays MPSoCs design due to the ever increasing power densities and huge energy consumption. This paper proposes a temperature-aware task mapping technique for energy optimization in systems with dynamic voltage selection capability. It evaluates the efficiency of this technique, based on the analysis of the factors that can influence the potential gains that can be expected from such a technique, compared to a task mapping approach that ignores temperature.

Place, publisher, year, edition, pages
IEEE Computer Society, 2008
Keywords
embedded systems, energy optimization, temperature reduction, mapping, dynamic voltage selection
National Category
Computer Sciences
Identifiers
urn:nbn:se:liu:diva-42251 (URN)10.1109/DDECS.2008.4538754 (DOI)000256936300011 ()62035 (Local ID)978-1-4244-2276-0 (ISBN)e-978-1-4244-2277-7 (ISBN)62035 (Archive number)62035 (OAI)
Conference
11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS 2008), 16-18 April 2008, Bratislava, Slovakia
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2019-01-28
Bao, M., Andrei, A., Eles, P. I. & Peng, Z. (2008). Temperature-Aware Voltage Selection for Energy Optimization. In: Design, Automation and Test in Europe, 2008. Paper presented at Design, Automation and Test in Europe (DATE 2008), 10-14 March 2008, Munich, Germany (pp. 1083-1086). IEEE
Open this publication in new window or tab >>Temperature-Aware Voltage Selection for Energy Optimization
2008 (English)In: Design, Automation and Test in Europe, 2008, IEEE , 2008, p. 1083-1086Conference paper, Published paper (Refereed)
Abstract [en]

This paper proposes a temperature-aware dynamic voltage selection technique for energy minimization and presents a thorough analysis of the parameters that influence the potential gains that can be expected from such a technique, compared to a voltage selection approach that ignores temperature.

Place, publisher, year, edition, pages
IEEE, 2008
Series
Design, Automation, and Test in Europe Conference and Exhibition. Proceedings, ISSN 1530-1591
Keywords
embedded systems, voltage selection, power optimization, temperature variations, leakage
National Category
Computer Sciences
Identifiers
urn:nbn:se:liu:diva-39640 (URN)10.1109/DATE.2008.4484920 (DOI)000257940700257 ()50432 (Local ID)978-3-9810801-3-1 (ISBN)e-978-3-9810801-4-8 (ISBN)50432 (Archive number)50432 (OAI)
Conference
Design, Automation and Test in Europe (DATE 2008), 10-14 March 2008, Munich, Germany
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2019-01-28
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