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2015 (English)In: Journal of Physics D: Applied Physics, ISSN 0022-3727, E-ISSN 1361-6463, Vol. 48, no 41, p. 415102-Article in journal (Refereed) Published
Abstract [en]
YAlN is a new member of the group-III nitride family with potential for applications in next generation piezoelectric and light emitting devices. We report the infrared dielectric functions and optical phonons of wurtzite (0001) YxAl1-xN epitaxial films with 0 less than= x less than= 0.22. The films are grown by magnetron sputtering epitaxy on c-plane Al2O3 and their phonon properties are investigated using infrared spectroscopic ellipsometry and Raman scattering spectroscopy. The infrared-active E-1(TO) and LO, and the Raman active E-2 phonons are found to exhibit one-mode behavior, which is discussed in the framework of the MREI model. The compositional dependencies of the E-1(TO), E-2 and LO phonon frequencies, the high-frequency limit of the dielectric constant, epsilon(infinity), the static dielectric constant, epsilon(0), and the Born effective charge Z(B) are established and discussed.
Place, publisher, year, edition, pages
IOP PUBLISHING LTD, 2015
Keywords
YAlN; phonons; infrared dielectric function
National Category
Physical Sciences Chemical Sciences
Identifiers
urn:nbn:se:liu:diva-122192 (URN)10.1088/0022-3727/48/41/415102 (DOI)000362007100004 ()
Note
Funding Agencies|Swedish Research Council (VR) [2013-5580]; Swedish Governmental Agency for Innovation Systems (VINNOVA) [2011-03486]; Swedish Foundation for Strategic Research (SSF) [2012FFL12-0181]; National Science Foundation [MRSEC DMR-0820521, EPS-1004094]; Stiftelsen Lars Hiertas Minne [FO2013-0587]; [RECI/FIS-NAN/0183/2012 (FCOMP-01-0124-FEDER-027494)]
2015-10-262015-10-232023-12-28