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Measuring the potential distribution inside soft organic semiconductors with a scanning-tunneling microscope
Eindhoven University of Technology, Netherlands.ORCID-id: 0000-0002-7104-7127
Eindhoven University of Technology, Netherlands.
Eindhoven University of Technology, Netherlands.
Eindhoven University of Technology, Netherlands.
Vise andre og tillknytning
2002 (engelsk)Inngår i: Physica. E, Low-Dimensional systems and nanostructures, ISSN 1386-9477, E-ISSN 1873-1759, Vol. 13, nr 2-4, s. 1247-1250Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

For the first time, we directly measured the potential distribution inside organic semiconductors. Combined spectroscopic measurements are performed on MDMO-PPV layers on Au and Yb substrates, using a scanning-tunneling microscope. The results are analyzed with a model that treats both current injection and bulk transport in detail. It is found that tip height-bias curves, which are taken by following the height of the STM tip as a function of bias, while the STM feedback system is active, reflect the potential distribution between tip and sample electrode. (C) 2002 Elsevier Science B.V. All rights reserved.

sted, utgiver, år, opplag, sider
Elsevier , 2002. Vol. 13, nr 2-4, s. 1247-1250
Emneord [en]
scanning-tunneling microscopy; organic semiconductor; poly-phenylene-vinylene
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Identifikatorer
URN: urn:nbn:se:liu:diva-141525DOI: 10.1016/S1386-9477(02)00346-6ISI: 000176869100269OAI: oai:DiVA.org:liu-141525DiVA, id: diva2:1145590
Konferanse
10th International Conference on Modulated Semiconductor Structures
Tilgjengelig fra: 2017-09-29 Laget: 2017-09-29 Sist oppdatert: 2017-10-04

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Kemerink, Martijn
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