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Colloidal Synthesis and Characterisation of (a) Na0.5K0.5NbO3 Thin Films; and (b) Functionalised Gd2O3 Nanocrystals
Linköpings universitet, Institutionen för fysik, kemi och biologi, Oorganisk Kemi. Linköpings universitet, Tekniska högskolan.
2004 (engelsk)Licentiatavhandling, med artikler (Annet vitenskapelig)
Abstract [en]

(a) Thin films of the perovskite structured Na0.5K0.5NbO3 (NKN) have been synthesised with several different sol-gel methods. Only one method gave pure NKN phase while the other methods gave extra peaks in the x-ray diffraction patterns, indicating that other, unidentified, phases were present. Scanning electron microscopy revealed grain sizes ranging from about 50 to 300 nm. The films prepared by chemical methods are compared with sputtered thin films.

(b) Nanocrystals of Gd2O3 have been prepared by various methods, using e.g. trioctylphosphine oxide (TOPO), diethylene glycol (DEG). The crystalline particles were of sizes 5 to 15 nm. Onto the surface of the particles, made with DEG, different carboxylic acids e.g. oleic acid or citric acid etc, were adsorbed. From IR measurements the bonding to the surface is recognised as chemisorbed via the carboxylate group in a bidentate or bridging fashion, with preference for the bridging coordination. The organic acid-particle complexes were characterised by XRPD, TEM, FTIR, Raman and XPS.

sted, utgiver, år, opplag, sider
Linköping: Linköping University Electronic Press , 2004. , s. 71
Serie
Linköping Studies in Science and Technology. Thesis, ISSN 0280-7971 ; 1115
HSV kategori
Identifikatorer
URN: urn:nbn:se:liu:diva-54128Lokal ID: LiU-TEK-LIC-2004:44ISBN: 91-8529-531-0 (tryckt)OAI: oai:DiVA.org:liu-54128DiVA, id: diva2:299935
Presentation
(engelsk)
Opponent
Veileder
Tilgjengelig fra: 2010-02-25 Laget: 2010-02-24 Sist oppdatert: 2013-11-14bibliografisk kontrollert
Delarbeid
1. Low temperature growth and characterization of (Na,K)NbOx thin films
Åpne denne publikasjonen i ny fane eller vindu >>Low temperature growth and characterization of (Na,K)NbOx thin films
Vise andre…
2003 (engelsk)Inngår i: Journal of Crystal Growth, ISSN 0022-0248, E-ISSN 1873-5002, Vol. 254, nr 3-4, s. 400-404Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Thin (Na,K)NbOx perovskite films (NKN) have been deposited on SiO2/Si(0 0 1) substrates at low temperatures, from 350°C to 550°C, by RF magnetron sputtering. The effects of substrate temperature on microstructure, electrical-, and mechanical properties of the NKN films have been studied. X-ray diffraction analysis revealed that films deposited at temperatures in the range of 450–550°C were crystalline, growing as a single phase, with a preferred orientation of (0 0 1). Films deposited at 350°C, were shown to be amorphous. The growth temperature had a strong influence on the electrical properties of the NKN films and the relative dielectric constants of the obtained films were in between 38 and 78. Variations of the mechanical properties of the NKN films were observed for different substrate temperatures: The elastic moduli and the hardness values ranged from 205±26 to 93±29 GPa, and from 12±2 to around 2 GPa, for films deposited at 550°C and 450°C, respectively.

Emneord
A1. Characterization; A3. Physical vapor deposition processes; B1. Niobates; B2. Dielectric materials
HSV kategori
Identifikatorer
urn:nbn:se:liu:diva-46555 (URN)10.1016/S0022-0248(03)01184-9 (DOI)000183468100016 ()
Tilgjengelig fra: 2009-10-11 Laget: 2009-10-11 Sist oppdatert: 2017-12-13
2. Microstructure/dielectric property relationship of low temperature synthesised (Na,K)NbOx thin films
Åpne denne publikasjonen i ny fane eller vindu >>Microstructure/dielectric property relationship of low temperature synthesised (Na,K)NbOx thin films
Vise andre…
2004 (engelsk)Inngår i: Journal of Crystal Growth, ISSN 0022-0248, E-ISSN 1873-5002, Vol. 262, nr 1-4, s. 322-326Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Thin films of (Na,K)NbOx (NKN) were grown by reactive RF magnetron sputtering on polycrystalline Pt80Ir20 substrates, at relatively low growth temperatures between 300°C and 450°C. The results show that the electrical performance and the microstructure of the films are a strong function of the substrate temperature. X-ray diffraction of films grown up to 400°C revealed the formation of only one crystalline NKN-phase with a preferred (0 0 2)-orientation. However, a mixed orientation together with a secondary, paraelectric potassium niobate phase, were observed for NKN films deposited at 450°C. The differences in the microstructure explains the variations in the dielectric constants and losses: The single phase NKN films displayed a dielectric constant and a dielectric loss of 506 and 0.011, respectively, while the films with mixed phases exhibited values of 475 and 0.022, respectively. The possibility of fabricating NKN films with relatively high dielectric properties at low growth temperatures, as demonstrated here, is of high technological importance.

Emneord
A1. Characterization, A3. Physical vapor deposition processes, B1. Niobates, B2. Dielectric materials
HSV kategori
Identifikatorer
urn:nbn:se:liu:diva-45820 (URN)10.1016/j.jcrysgro.2003.10.035 (DOI)000189098700050 ()
Tilgjengelig fra: 2009-10-11 Laget: 2009-10-11 Sist oppdatert: 2017-12-13
3. Sol–gel synthesis and characterization of Na0.5K0.5NbO3 thin films
Åpne denne publikasjonen i ny fane eller vindu >>Sol–gel synthesis and characterization of Na0.5K0.5NbO3 thin films
2005 (engelsk)Inngår i: Journal of Crystal Growth, ISSN 0022-0248, E-ISSN 1873-5002, Vol. 281, nr 2-4, s. 468-474Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Thin films of the perovskite structured Na0.5K0.5NbO3 (NKN) have been synthesized with three different sol–gel methods, viz. the alkoxide method, a modified Pechini method and a somewhat novel oxalate method, based on 2-methoxy ethanol as solvent with oxalic acid and ethylene glycol as chelating ligand and stabilizer. Only one method (the modified Pechini method) gave pure NKN phase while the other two methods gave extra peaks in the X-ray diffraction patterns, indicating that other, unidentified, phases were present. SEM images revealed grain sizes ranging from 100 to 300 nm.

Emneord
Characterization; Chemical solution deposition processes; Niobates; Dielectric materials
HSV kategori
Identifikatorer
urn:nbn:se:liu:diva-13299 (URN)10.1016/j.jcrysgro.2005.04.044 (DOI)000231011600038 ()
Tilgjengelig fra: 2008-05-21 Laget: 2008-05-21 Sist oppdatert: 2017-12-13
4. Synthesis and characterisation of Gd2O3 nanocrystals functionalised by organic acids
Åpne denne publikasjonen i ny fane eller vindu >>Synthesis and characterisation of Gd2O3 nanocrystals functionalised by organic acids
Vise andre…
2005 (engelsk)Inngår i: Journal of Colloid and Interface Science, ISSN 0021-9797, E-ISSN 1095-7103, Vol. 288, nr 1, s. 140-148Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Nanocrystals of Gd2O3 have been prepared by various methods, using, e.g., trioctylphosphine oxide (TOPO), diethylene glycol (DEG) or glycine. The crystalline particles were of sizes 5 to 15 nm. Different carboxylic acids, e.g., oleic acid or citric acid, were adsorbed onto the surface of the particles made with DEG. IR measurements show that the molecules coordinate to the Gd2O3 surface via the carboxylate group in a bidentate or bridging manner. The organic-acid/particle complexes were characterised by XRPD, TEM, FTIR, Raman, and XPS.

Emneord
Nanocrystals; Synthesis; Functionalisation; IR; XPS
HSV kategori
Identifikatorer
urn:nbn:se:liu:diva-13295 (URN)10.1016/j.jcis.2005.02.089 (DOI)000229861600019 ()
Tilgjengelig fra: 2008-05-21 Laget: 2008-05-21 Sist oppdatert: 2017-12-13

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