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Polytype pure sp2-BN thin films as dictated by the substrate crystal structure
Linköpings universitet, Institutionen för fysik, kemi och biologi. Linköpings universitet, Tekniska högskolan.
Linköpings universitet, Institutionen för fysik, kemi och biologi, Kemi. Linköpings universitet, Tekniska högskolan.ORCID-id: 0000-0002-7171-5383
Linköpings universitet, Institutionen för fysik, kemi och biologi, Tunnfilmsfysik. Linköpings universitet, Tekniska högskolan.
Hungarian Academic Science, Hungary .
Vise andre og tillknytning
2015 (engelsk)Inngår i: Chemistry of Materials, ISSN 0897-4756, E-ISSN 1520-5002, Vol. 27, nr 5, s. 1640-1645Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Boron nitride (BN) is a promising semiconductor material, but its current exploration is hampered by difficulties in growth of single crystalline phase-pure thin films. We compare the growth of sp2-BN by chemical vapor deposition on (0001) 6H-SiC and on (0001) α-Al2O3 substrates with an AlN buffer layer. Polytype-pure rhombohedral BN (r-BN) with a thickness of 200 nm is observed on SiC whereas hexagonal BN (h-BN) nucleates and grows on the AlN buffer layer. For the latter case after a thickness of 4 nm, the h-BN growth is followed by r-BN growth to a total thickness of 200 nm. We find that the polytype of the sp2-BN films is determined by the ordering of Si-C or Al-N atomic pairs in the underlying crystalline structure (SiC or AlN). In the latter case the change from h-BN to r-BN is triggered by stress relaxation. This is important for the development of BN semiconductor device technology.

sted, utgiver, år, opplag, sider
Washington: American Chemical Society (ACS), 2015. Vol. 27, nr 5, s. 1640-1645
HSV kategori
Identifikatorer
URN: urn:nbn:se:liu:diva-112577DOI: 10.1021/cm5043815ISI: 000350919000025OAI: oai:DiVA.org:liu-112577DiVA, id: diva2:768463
Merknad

This work was supported by the Swedish Research Council (VR, Grant 621-2013-5585), Carl Tryggers Foundation (No. 12:175), and the CeNano program at Linkoping University. H.H. acknowledges support from the Swedish Government Strategic Research Area in Materials Science on Functional Materials at Linkoping University (Faculty Grant SFO-Mat-LiU No. 2009-00971). Z.C. acknowledges the support of the Bolyai Janos research scholarship of the Hungarian Academy of Sciences. The Knut and Alice Wallenberg (KAW) Foundation is acknowledged for the Electron Microscope Laboratory in Linkoping. Sven G. Andersson is gratefully acknowledged for his technical support of the growth activities.

Tilgjengelig fra: 2014-12-04 Laget: 2014-12-04 Sist oppdatert: 2017-12-05bibliografisk kontrollert
Inngår i avhandling
1. Chemical Vapour Deposition of sp2 Hybridised Boron Nitride
Åpne denne publikasjonen i ny fane eller vindu >>Chemical Vapour Deposition of sp2 Hybridised Boron Nitride
2014 (engelsk)Doktoravhandling, med artikler (Annet vitenskapelig)
Abstract [en]

The aim of this work was to develop a chemical vapour deposition process and understand the growth of sp2 hybridised Boron Nitride (sp2-BN). Thus, the growth on different substrates together with the variation of growth parameters was investigated in details and is presented in the papers included in this thesis. Deposited films of sp2-BN were characterised with the purpose to determine optimal deposition process parameters for the growth of high crystal quality thin films with further investigations of chemical composition, morphology and other properties important for the implementation of this material towards electronic, optoelectronic devices and devices based on graphene/BN heterostructures.

For the growth of sp2-BN triethyl boron and ammonia were employed as B and N precursors, respectively. Pure H2 as carrier gas is found to be necessary for the growth of crystalline sp2-BN. Addition of small amount of silane to the gas mixture improves the crystalline quality of the growing sp2-BN film.

It was observed that for the growth of crystalline sp2-BN on c-axis oriented α-Al2O3 a thin and strained AlN buffer layer is needed to support epitaxial growth of sp2-BN, while it was possible to deposit rhombohedral BN (r-BN) on various polytypes of SiC without the need for a buffer layer. The growth temperature suitable for the growth of  crystalline sp2-BN is 1500 °C. Nevertheless, the growth of crystalline sp2-BN was also observed on α-Al2O3 with an AlN buffer layer at a lower temperature of 1200 °C. Growth at this low temperature was found to be hardly controllable due to the low amount of Si that is necessary at this temperature and its accumulation in the reaction cell. When SiC was used as a substrate at the growth temperature of 1200 °C, no crystalline sp2-BN was formed, according to X-ray diffraction.

Crystalline structure investigations of the deposited films showed formation of twinned r-BN on both substrates used. Additionally, it was found that the growth on α-Al2O3 with an AlN buffer layer starts with the formation of hexagonal BN (h-BN) for a thickness of around 4 nm. The formation of h-BN was observed at growth temperatures of 1200 °C and 1500 °C on α-Al2O3 with AlN buffer layer while there were no traces of h-BN found in the films deposited on SiC substrates in the temperature range between 1200 °C and 1700 °C. As an explanation for such growth behaviour, reproduction of the substrate crystal stacking is suggested.  Nucleation and growth mechanism are investigated and presented in the papers included in this thesis.

sted, utgiver, år, opplag, sider
Linköping: Linköping University Electronic Press, 2014. s. 54
Serie
Linköping Studies in Science and Technology. Thesis, ISSN 0280-7971 ; 1632
HSV kategori
Identifikatorer
urn:nbn:se:liu:diva-112580 (URN)10.3384/diss.diva-112580 (DOI)978-91-7519-193-5 (ISBN)
Disputas
2015-02-10, Planck, Fysikhuset, Campus Valla, Linköpings universitet, Linköping, 09:15 (engelsk)
Opponent
Veileder
Tilgjengelig fra: 2014-12-04 Laget: 2014-12-04 Sist oppdatert: 2019-10-12bibliografisk kontrollert

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