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Terahertz to Mid-infrared Dielectric Properties of Polymethacrylates for Stereolithographic Single Layer Assembly
Univ N Carolina, NC 28223 USA.
Univ N Carolina, NC 28223 USA.
Lasertel, AZ 85743 USA.
JA Woollam Co Inc, NE 68508 USA.
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2019 (English)In: Journal of Infrared, Millimeter and Terahertz Waves, ISSN 1866-6892, E-ISSN 1866-6906, Vol. 40, no 9, p. 971-979Article in journal (Refereed) Published
Abstract [en]

The fabrication of terahertz (THz) optics with arbitrary shapes via polymethacrylate-based stereolithography is very attractive as it may offer a rapid, low-cost avenue towards optimized THz imaging applications. In order to design such THz optical components appropriately, accurate knowledge of the complex dielectric function of the materials used for stereolithographic fabrication is crucial. In this paper, we report on the complex dielectric functions of several polymethacrylates frequently used for stereolithographic fabrication. Spectroscopic ellipsometry data sets from the THz to mid-infrared spectral range were obtained from isotropically cross-linked polymethacrylate samples. The data sets were analyzed using stratified layer optical model calculations with parameterized model dielectric functions. While the infrared spectral range is dominated by a number of strong absorption features with Gaussian profiles, these materials are found to exhibit only weak absorption in the THz frequency range. In conclusion, we find that thin transmissive THz optics can be efficiently fabricated using polymethacrylate-based stereolithographic fabrication.

Place, publisher, year, edition, pages
SPRINGER , 2019. Vol. 40, no 9, p. 971-979
Keywords [en]
Stereolithography; THz; Infrared; Ellipsometry; Polymethacrylates; Rapid prototyping
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Identifiers
URN: urn:nbn:se:liu:diva-160604DOI: 10.1007/s10762-019-00616-xISI: 000485313900007OAI: oai:DiVA.org:liu-160604DiVA, id: diva2:1362706
Note

Funding Agencies|National Science Foundation within the I/UCRC Center for MetamaterialsNational Science Foundation (NSF) [1624572]; Department of Physics and Optical Science of the University of North Carolina at Charlotte; Swedish Agency for Innovation SystemsVinnova [2014-04712]

Available from: 2019-10-21 Created: 2019-10-21 Last updated: 2019-10-21

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Semiconductor MaterialsFaculty of Science & Engineering
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