We propose a visual analysis method for the comparison and evaluation of structures in solid-state materials based on the electron density field using topological analysis. The work has been motivated by a material science application, specifically looking for new so-called layered materials whose physical properties are required in many modern technological developments. Due to the incredibly large search space, this is a slow and tedious process, requiring efficient data analysis to characterize and understand the material properties. The core of our proposed analysis pipeline is an abstract bar representation that serves as a concise signature of the material, supporting direct comparison and also an exploration of different material candidates.