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Protocol requirements in an SJTAG/IJTAG environment
Ericsson AB, Stockholm, Sweden.
Linköpings universitet, Institutionen för datavetenskap. Linköpings universitet, Tekniska högskolan.
Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska högskolan.
2007 (engelsk)Inngår i: IEEE International Test Conference, 2007, IEEE , 2007, s. 942-950Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

Integrated Circuits, Printed Circuits Boards, and Multi-board systems are becoming increasingly complex to test. A major obstacle is test access, which would be eased by effective standards for the communication between devices-under-test (DUTs) and the test manager. Currently, the Internal Joint Test Access Group (IJTAG) work at micro-level on a standard for interfacing embedded on-chip instruments while the System JTAG (SJTAG) work at macro-level on a standard for system-level test management that connects IJTAG compatible instruments with the system test manager. In this paper we discuss requirements on a test protocol to be used in an SJTAG/IJTAG environment. We have from a number of use scenarios made an analysis and defined protocol requirements. We have taken the Standard Test and Programming Language (STAPL), which is built around a player (interpreter), and defined required extensions. The extensions have been implemented in an extended version of STAPL and we have made experiments with a PC acting as test controller and an FPGA being the DUT.

sted, utgiver, år, opplag, sider
IEEE , 2007. s. 942-950
Serie
International Test Conference. Proceedings, ISSN 1089-3539
Emneord [en]
testing, Integrated Circuits, Printed Circuits Boards, Multi-board systems, test protocol
HSV kategori
Identifikatorer
URN: urn:nbn:se:liu:diva-39296DOI: 10.1109/TEST.2007.4437658ISI: 000255939900103Lokal ID: 47829ISBN: 978-1-4244-1127-6 (tryckt)ISBN: e-978-1-4244-1128-3 OAI: oai:DiVA.org:liu-39296DiVA, id: diva2:260145
Konferanse
IEEE International Test Conference (ITC 2007), 21-26 October 2007, Santa Clara, California, USA
Tilgjengelig fra: 2009-10-10 Laget: 2009-10-10 Sist oppdatert: 2018-01-13

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Totalt: 159 treff
RefereraExporteraLink to record
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  • de-DE
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  • sv-SE
  • Annet språk
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  • asciidoc
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