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Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska högskolan.
NXP Semiconductors Research, The Netherlands.
NXP Semiconductors Research, The Netherlands.
NXP Semiconductors Research, The Netherlands.
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2007 (Engelska)Ingår i: Design, Automation & Test in Europe Conference & Exhibition, 2007. DATE '07, Nice, France: IEEE , 2007, s. 859-864Konferensbidrag, Publicerat paper (Refereegranskat)
Abstract [en]

Embedded First-In First-Out (FIFO) memories are increasingly used in many IC designs. We have created a new full-custom embedded FIFO module with asynchronous read and write clocks, which is at least a factor two smaller and also faster than SRAM-based and standard-cell-based counterparts. The detection qualities of the FIFO test for both hard and weak resistive shorts and opens have been analyzed by an IFA-like method based on analog simulation. The defect coverage of the initial FIFO test for shorts in the bit-cell matrix has been improved by inclusion of an additional data background and low-voltage testing; for low-resistant shorts, 100% defect coverage is obtained. The defect coverage for opens has been improved by a new test procedure which includes waiting periods.

Ort, förlag, år, upplaga, sidor
Nice, France: IEEE , 2007. s. 859-864
Serie
Design, Automation, and Test in Europe Conference and Exhibition. Proceedings, ISSN 1530-1591
Nyckelord [en]
embedded systems, testing, FIFO, memory, test quality analysis
Nationell ämneskategori
Datavetenskap (datalogi)
Identifikatorer
URN: urn:nbn:se:liu:diva-39308DOI: 10.1109/DATE.2007.364400ISI: 000252175700145Lokalt ID: 47849ISBN: 978-3-9810801-2-4 (tryckt)OAI: oai:DiVA.org:liu-39308DiVA, id: diva2:260157
Konferens
Design, Automation and Test in Europe Conference and Exhibition (DATE 2007), 16-20 April 2007, Nice, France
Tillgänglig från: 2009-10-10 Skapad: 2009-10-10 Senast uppdaterad: 2018-01-13

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Larsson, Erik

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Larsson, Erik
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ESLAB - Laboratoriet för inbyggda systemTekniska högskolan
Datavetenskap (datalogi)

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Totalt: 73 träffar
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