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Assessment of phonon mode characteristics via infrared spectroscopic ellipsometry on a-plane GaN
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .ORCID iD: 0000-0002-8112-7411
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology.
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Materials Science .
Linköping University, The Institute of Technology. Linköping University, Department of Physics, Chemistry and Biology, Applied Optics .ORCID iD: 0000-0001-9229-2028
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2006 (English)In: Physica status solidi. B, Basic research, ISSN 0370-1972, E-ISSN 1521-3951, Vol. 243, no 7, p. 1594-1598Article in journal (Refereed) Published
Abstract [en]

Generalized infrared spectroscopic ellipsometry was applied to study the vibrational properties of anisotropically strained a-plane GaN films with different thicknesses. We have established a correlation between the phonon mode parameters and the strain, which allows the determination of the deformation potentials and strain-free frequency of the GaN A,(TO) mode. These results are compared with previous theoretical and experimental findings and discussed.

Place, publisher, year, edition, pages
2006. Vol. 243, no 7, p. 1594-1598
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Engineering and Technology
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URN: urn:nbn:se:liu:diva-46014DOI: 10.1002/pssb.200565400OAI: oai:DiVA.org:liu-46014DiVA, id: diva2:266910
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2023-12-28

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Darakchieva, VanyaPaskova, TanjaPaskov, PlamenArwin, HansMonemar, Bo

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