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Study on Combined Test-Data Compression and Test Planning for Testing of Modular SoCs
Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska högskolan.
Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska högskolan.
Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system. Linköpings universitet, Tekniska högskolan.
Duke University, USA.
2010 (engelsk)Inngår i: Design and Test Technology for Dependable Systems-on-chip / [ed] Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus, Information Science Publishing , 2010Kapittel i bok, del av antologi (Annet vitenskapelig)
Abstract [en]

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences.

Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined "classical" design and test topics and solutions for IC test technology and fault-tolerant systems.

sted, utgiver, år, opplag, sider
Information Science Publishing , 2010.
HSV kategori
Identifikatorer
URN: urn:nbn:se:liu:diva-63304ISBN: 16-096-0212-9 (tryckt)ISBN: 978-1609-6021-23 OAI: oai:DiVA.org:liu-63304DiVA, id: diva2:377995
Tilgjengelig fra: 2010-12-15 Laget: 2010-12-15 Sist oppdatert: 2013-04-18bibliografisk kontrollert

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Larsson, AndersIngelsson, UrbanLarsson, Erik

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Totalt: 59 treff
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