liu.seSearch for publications in DiVA
Endre søk
RefereraExporteraLink to record
Permanent link

Direct link
Referera
Referensformat
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Annet format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annet språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf
Calibration of high-resolution flash ADCS based on histogram test methods
ECE Dept. Isfahan University of Technology, Isfahan, Iran.
ECE Dept. Isfahan University of Technology, Isfahan, Iran.
Linköpings universitet, Institutionen för systemteknik, Elektroniksystem. Linköpings universitet, Tekniska högskolan.ORCID-id: 0000-0002-2144-6795
Linköpings universitet, Institutionen för systemteknik, Elektroniksystem. Linköpings universitet, Tekniska högskolan.
Vise andre og tillknytning
2010 (engelsk)Inngår i: Electronics, Circuits, and Systems (ICECS), 2010 17th IEEE International Conference on, IEEE , 2010, s. 114-117Konferansepaper, Publicerat paper (Annet vitenskapelig)
Abstract [en]

In this paper a calibration technique for high-resolution, flash analog- to-digital converters (ADCs) based on histogram test methods is proposed. A probability density function, PDF, generator circuit is utilized to generate a triangular signal with a constant PDF, i.e., uniform distribution, as a test signal. In the proposed technique both offset estimation and trimming are performed without imposing any changes on the comparator structure in the ADC. The proposed algorithm estimates the offset values and stores them in a RAM. The trimming circuit uses the stored values and performs the trimming by adjusting the reference voltages to the comparators. An 8-bit flash ADC with a 1-V reference voltage, a comparator offset distribution with σos ≈ 30 mV, and a 10-bit test signal with about 3% nonlinearity are used in the simulations. The results show that the calibration improves the DNL and INL from about 3.6/3.9 LSB to about 0.9/0.75 LSB, respectively.

sted, utgiver, år, opplag, sider
IEEE , 2010. s. 114-117
Emneord [en]
RAM;calibration technique;comparator;generator circuit;high-resolution flash analog-to-digital converter;histogram test method;offset estimation;offset trimming;probability density function;triangular signal generation;trimming circuit;uniform distribution;voltage 1 V;word length 10 bit;word length 8 bit;analogue-digital conversion;calibration;comparators (circuits);probability;random-access storage;signal generators;
HSV kategori
Identifikatorer
URN: urn:nbn:se:liu:diva-70623DOI: 10.1109/ICECS.2010.5724467ISBN: 978-1-4244-8155-2 (tryckt)OAI: oai:DiVA.org:liu-70623DiVA, id: diva2:440978
Konferanse
2010 IEEE International Conference on Electronics, Circuits, and Systems, 12-15 Dec. 2010, Athens, Greece
Tilgjengelig fra: 2011-09-14 Laget: 2011-09-14 Sist oppdatert: 2018-11-08

Open Access i DiVA

Fulltekst mangler i DiVA

Andre lenker

Forlagets fulltekst

Personposter BETA

Wikner, JacobPalmkvist, KentVesterbacka, Mark

Søk i DiVA

Av forfatter/redaktør
Wikner, JacobPalmkvist, KentVesterbacka, Mark
Av organisasjonen

Søk utenfor DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric

doi
isbn
urn-nbn
Totalt: 132 treff
RefereraExporteraLink to record
Permanent link

Direct link
Referera
Referensformat
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Annet format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annet språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf