liu.seSearch for publications in DiVA
Endre søk
RefereraExporteraLink to record
Permanent link

Direct link
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Annet format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annet språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf
Design of an in-field Embedded Test Controller
Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system.
Linköpings universitet, Institutionen för datavetenskap, ESLAB - Laboratoriet för inbyggda system.
2011 (engelsk)Independent thesis Advanced level (degree of Master (Two Years)), 20 poäng / 30 hpOppgave
Abstract [en]

Electronic systems installed in their operation environments often require regular testing. The nanometer transistor size in new IC design technologies makes the electronic systems more vulnerable to defects. Due to certain reasons like wear out or over heating and difficulty to access systems in remote areas, in-field testing is vital. For in-field testing, embedded test controllers are more effective in terms of maintenance cost than external testers. For in-field testing, fault coverage, high memory requirements, test application time, flexibility and diagnosis are the main challenges.

In this thesis, an Embedded Test Controller (ETC) is designed and implemented which provides flexible in-field testing and diagnostic capability with high fault coverage. The ETC has relatively low memory requirements for storing deterministic test data as compared to storing complete test vectors. The test patterns used by the ETC are stored separately for each component of the device under test, in system memory. The test patterns for each component are concatenated during test application according to a flexible test command. To address test application time (which corresponds to down time of the system), two different versions of the ETC are designed and implemented. These versions provide a trade off between test application time and hardware overhead. Hence, a system integrator can select which version to use depending on the cost factors at hand. The ETC can make use of an embedded CPU in the Device Under Test (DUT), for performing test on the DUT. For DUTs where no embedded CPU is available, there is the additional cost of a test specific CPU for the ETC. To access the DUT during the test application, the IEEE 1149.1 (JTAG) interface is used. The ETC generates test result that provides information of failing ICs and patterns.

The designed and implemented versions of the ETC are validated through experimentations. An FPGA platform is used for experimental validation of the ETC versions. A set of tools are developed for automating the experimental setup. Performance and hardware cost of the ETC versions are evaluated using the ITC'02 benchmarks.

sted, utgiver, år, opplag, sider
2011. , s. 85
Emneord [en]
in-field testing, embedded testing, automated in-field diagnosis
HSV kategori
Identifikatorer
URN: urn:nbn:se:liu:diva-70791ISRN: LIU-IDA/LITH-EX-A--11/028--SEOAI: oai:DiVA.org:liu-70791DiVA, id: diva2:441781
Fag / kurs
Computer and information science at the Institute of Technology
Presentation
2011-08-25, John von Neumann, Linköping, 10:00 (engelsk)
Uppsök
Technology
Veileder
Examiner
Tilgjengelig fra: 2011-09-19 Laget: 2011-09-19 Sist oppdatert: 2011-09-19bibliografisk kontrollert

Open Access i DiVA

fulltext(2785 kB)556 nedlastinger
Filinformasjon
Fil FULLTEXT02.pdfFilstørrelse 2785 kBChecksum SHA-512
5e27b170fcee0e7e83e5a7609c0ab357843d5560f133b8aee579303734a59dcddfb6a0d2268be6815ab47ca46bb37538907910124483cfd60a6c3b7f2a6c3f2a
Type fulltextMimetype application/pdf

Søk i DiVA

Av forfatter/redaktør
Shah, GhafoorArslan, Saad
Av organisasjonen

Søk utenfor DiVA

GoogleGoogle Scholar
Totalt: 561 nedlastinger
Antall nedlastinger er summen av alle nedlastinger av alle fulltekster. Det kan for eksempel være tidligere versjoner som er ikke lenger tilgjengelige

urn-nbn

Altmetric

urn-nbn
Totalt: 591 treff
RefereraExporteraLink to record
Permanent link

Direct link
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Annet format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annet språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf