Piezoelectricity enhancement of P(VDF/TrFE) by X-ray irradiation
2016 (English)In: Organic electronics, ISSN 1566-1199, E-ISSN 1878-5530, Vol. 37, 257-262 p.Article in journal (Refereed) Published
Organic electronics is becoming more and more important because the low level of fabrication and deposition complexity even at large scale makes it a good candidate for future low cost technological product development. P(VDF-TrFE) is a co-polymer of special interest due its ferroelectric property enabling usage in re-programmable non-volatile organic memory and magnetoelectric sensors. Piezo force microscopy (PFM) provides access to the technologically relevant ferroelectric polarisability and its remanent polarization via imaging of the piezoelectric property. Here we use PFM to show that piezoelectric response of a P(VDF-TrFE) film can be enhanced by up to 260 % after soft X-ray irradiation. This enhancement correlates with morphological change of part of the film, from amorphous to crystalline. An optimal irradiation dose is found above which the film gets eroded and the piezoelectric response gets lowered. (C) 2016 Elsevier B.V. All rights reserved.
Place, publisher, year, edition, pages
ELSEVIER SCIENCE BV , 2016. Vol. 37, 257-262 p.
AFM; STXM; Organic memory; Piezoelectric polymer; Morphology; X-ray irradiation; Piezo force microscopy; P(VDF-TrFE)
Other Physics Topics
IdentifiersURN: urn:nbn:se:liu:diva-131877DOI: 10.1016/j.orgel.2016.06.039ISI: 000382248000035OAI: oai:DiVA.org:liu-131877DiVA: diva2:1036442
Funding Agencies|European Community ; Analytical Platform of the Swiss Competence Center for Materials Research and Technology (CCMX) of the ETH Domain; Empa Forschungskommission; PSI Forschungskommission; CCMX; Bundesministerium fur Bildung und Forschung [05KS7WE1, 05K10WEA]2016-10-132016-10-112016-10-13