Surface recombination in ZnO nanorods grown by chemical bath deposition
2008 (English)In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 104, no 7, 073526- p.Article in journal (Refereed) Published
Verticallywell-aligned ZnO nanorods on Si substrates were prepared by atwo-step chemical bath deposition (CBD) method. The optical properties ofthe grown ZnO nanorods were investigated by time resolved photoluminescencespectroscopy. It was found that the effective decay time ofthe near bandgap recombination in the CBD grown ZnO nanorodsstrongly depends on the diameter of the ZnO nanorods. Typically,the decay curves obtained from these ZnO nanorods show acombination of two exponential decays. The experimental results show thatthe fast exponential decay is related to the surface recombinationand the slow decay is related to the “bulk” decay.The measured decay time of the effective surface recombination decreaseswith decreasing diameter, while the bulk decay time remains unchanged.The results also show that an annealing treatment around 500 °Csignificantly reduces the surface recombination rate. A simple carrier andexciton diffusion equation is also used to determine the surfacerecombination velocity, which results in a value between 1.5 and4.5 nm/ps.
Place, publisher, year, edition, pages
2008. Vol. 104, no 7, 073526- p.
Annealing, excitons, II-VI semiconductors, nanostructured materials, nanotechnology, photoluminescence, semiconductor growth, surface recombination, time resolved spectra, wide band gap semiconductors, zinc compounds
National CategoryAtom and Molecular Physics and Optics
IdentifiersURN: urn:nbn:se:liu:diva-15425DOI: 10.1063/1.2991151OAI: oai:DiVA.org:liu-15425DiVA: diva2:114163
Original publication: Q. X. Zhao, L. L. Yang, M. Willander, B. E. Sernelius and P. O. Holtz, Surface recombination in ZnO nanorods grown by chemical bath deposition, 2008, Journal of Applied Physics, (104), 073526.http://dx.doi.org/10.1063/1.2991151. Copyright: Institute of Physics and IOP Publishing Limited, http://www.iop.org/EJ/journal/PM2008-11-062008-11-062014-06-24Bibliographically approved