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Estimating depolarization with the Jones matrix quality factor
JA Woollam Co Inc, NE 68508 USA.
JA Woollam Co Inc, NE 68508 USA.
JA Woollam Co Inc, NE 68508 USA.
JA Woollam Co Inc, NE 68508 USA.
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2017 (English)In: Applied Surface Science, ISSN 0169-4332, E-ISSN 1873-5584, Vol. 421, 494-499 p.Article in journal (Refereed) Published
Abstract [en]

Mueller matrix (MM) measurements offer the ability to quantify the depolarization capability of a sample. Depolarization can be estimated using terms such as the depolarization index or the average degree of polarization. However, these calculations require measurement of the complete MM. We propose an alternate depolarization metric, termed the Jones matrix quality factor, QJM, which does not require the complete MM. This metric provides a measure of how close, in a least-squares sense, a Jones matrix can be found to the measured Mueller matrix. We demonstrate and compare the use of QJM to other traditional calculations of depolarization for both isotropic and anisotropic depolarizing samples; including nonuniform coatings, anisotropic crystal substrates, and beetle cuticles that exhibit both depolarization and circular diattenuation. (C) 2016 Elsevier B.V. All rights reserved.

Place, publisher, year, edition, pages
ELSEVIER SCIENCE BV , 2017. Vol. 421, 494-499 p.
Keyword [en]
Depolarization; Spectroscopic ellipsometry; Mueller matrix; Mueller matrix ellipsometry; Jones matrix quality factor; Depolarization; Index; Thickness nonuniformity; Anisotropy
National Category
Manufacturing, Surface and Joining Technology
Identifiers
URN: urn:nbn:se:liu:diva-141108DOI: 10.1016/j.apsusc.2016.08.139ISI: 000408756700036OAI: oai:DiVA.org:liu-141108DiVA: diva2:1144796
Available from: 2017-09-27 Created: 2017-09-27 Last updated: 2017-09-27

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Arwin, Hans
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Thin Film PhysicsFaculty of Science & Engineering
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Citation style
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  • de-DE
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  • nn-NB
  • sv-SE
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