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Measuring the potential distribution inside soft organic semiconductors with a scanning-tunneling microscope
Eindhoven University of Technology, Netherlands.ORCID iD: 0000-0002-7104-7127
Eindhoven University of Technology, Netherlands.
Eindhoven University of Technology, Netherlands.
Eindhoven University of Technology, Netherlands.
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2002 (English)In: Physica. E, Low-Dimensional systems and nanostructures, ISSN 1386-9477, E-ISSN 1873-1759, Vol. 13, no 2-4, 1247-1250 p.Article in journal (Refereed) Published
Abstract [en]

For the first time, we directly measured the potential distribution inside organic semiconductors. Combined spectroscopic measurements are performed on MDMO-PPV layers on Au and Yb substrates, using a scanning-tunneling microscope. The results are analyzed with a model that treats both current injection and bulk transport in detail. It is found that tip height-bias curves, which are taken by following the height of the STM tip as a function of bias, while the STM feedback system is active, reflect the potential distribution between tip and sample electrode. (C) 2002 Elsevier Science B.V. All rights reserved.

Place, publisher, year, edition, pages
Elsevier , 2002. Vol. 13, no 2-4, 1247-1250 p.
Keyword [en]
scanning-tunneling microscopy; organic semiconductor; poly-phenylene-vinylene
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:liu:diva-141525DOI: 10.1016/S1386-9477(02)00346-6ISI: 000176869100269OAI: oai:DiVA.org:liu-141525DiVA: diva2:1145590
Conference
10th International Conference on Modulated Semiconductor Structures
Available from: 2017-09-29 Created: 2017-09-29 Last updated: 2017-10-04

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Kemerink, Martijn
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