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A Study of Damage Evolution in High Purity Nano TBCs During Thermal Cycling: A Fracture Mechanics Based modeling approach.
Linköping University, Department of Management and Engineering, Engineering Materials. Linköping University, Faculty of Science & Engineering.
Linköping University, Department of Management and Engineering, Solid Mechanics. Linköping University, Faculty of Science & Engineering.
(Beijing General Research Institute of Mining and Metallurgy, Beijing, China)
(Siemens Industrial Turbomachinery AB, Finspång)
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2017 (English)In: ASME Turbine Expo, Elsevier, 2017, Vol. 37, 2889-2899 p., 8Conference paper, Published paper (Refereed)
Abstract [en]

This work concerns the study of damage evolution in a newly developed high purity nano 8YSZ thermal barrier coating during thermal cyclic fatigue tests (TCF). TCF tests were conducted between 100 °C–1100 °C with a hold time of 1 h at 1100 °C, first till failure and later for interrupted tests. Cross section analysis along the diameter of the interrupted test samples revealed a mixed-type failure and that the most of the damage occurred towards the end of the coating’s life. To understand the most likely crack growth mechanism leading to failure, different crack growth paths have been modelled using finite element analysis. Crack growing from an existing defect in the top coat towards the top coat/TGO interface has been identified as the most likely mechanism. Estimated damage by the model could predict the rapid increase in the damage towards the end of the coating’s life.

Place, publisher, year, edition, pages
Elsevier, 2017. Vol. 37, 2889-2899 p., 8
Keyword [en]
Thermal cyclic fatigue, High purity nano YSZ, Crack growth modelling, Damage evolution
National Category
Materials Engineering
Identifiers
URN: urn:nbn:se:liu:diva-142310DOI: 10.1016/j.jeurceramsoc.2017.02.054Scopus ID: 2-s2.0-85014154522OAI: oai:DiVA.org:liu-142310DiVA: diva2:1152577
Conference
ASME Turbine Expo 2017, June 25-29, 2017, North Carolina, USA
Available from: 2017-10-25 Created: 2017-10-25 Last updated: 2017-11-21Bibliographically approved

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Jonnalagadda, Krisha PraveenEriksson, RobertPeng, Ru Lin

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Jonnalagadda, Krisha PraveenEriksson, RobertYuan, KangPeng, Ru Lin
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  • apa
  • harvard1
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