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Impact of local electrostatic field rearrangement on field ionization
Max Planck Inst Eisenforsch GmbH, Germany.
Univ Oxford, England.
Normandie Univ, France.
Max Planck Inst Eisenforsch GmbH, Germany.
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2018 (English)In: Journal of Physics D: Applied Physics, ISSN 0022-3727, E-ISSN 1361-6463, Vol. 51, no 10, article id 105601Article in journal (Refereed) Published
Abstract [en]

Field ion microscopy allows for direct imaging of surfaces with true atomic resolution. The high charge density distribution on the surface generates an intense electric field that can induce ionization of gas atoms. We investigate the dynamic nature of the charge and the consequent electrostatic field redistribution following the departure of atoms initially constituting the surface in the form of an ion, a process known as field evaporation. We report on a new algorithm for image processing and tracking of individual atoms on the specimen surface enabling quantitative assessment of shifts in the imaged atomic positions. By combining experimental investigations with molecular dynamics simulations, which include the full electric charge, we confirm that change is directly associated with the rearrangement of the electrostatic field that modifies the imaging gas ionization zone. We derive important considerations for future developments of data reconstruction in 3D field ion microscopy, in particular for precise quantification of lattice strains and characterization of crystalline defects at the atomic scale.

Place, publisher, year, edition, pages
IOP PUBLISHING LTD , 2018. Vol. 51, no 10, article id 105601
Keyword [en]
field ionization; field evaporation; molecular dynamics; field ion microscope; electrostatic field; microscopy
National Category
Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:liu:diva-145730DOI: 10.1088/1361-6463/aaaba6ISI: 000425627800001OAI: oai:DiVA.org:liu-145730DiVA, id: diva2:1192554
Note

Funding Agencies|IMPRS SurMat; EMC3 Labex; DYNAMITE project; CAMECA RINGAPT2 project

Available from: 2018-03-22 Created: 2018-03-22 Last updated: 2018-03-22

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Rolland, Nicolas
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Department of Science and TechnologyFaculty of Science & Engineering
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  • apa
  • harvard1
  • ieee
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  • Other style
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Language
  • de-DE
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  • nn-NB
  • sv-SE
  • Other locale
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Output format
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