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Machine Learning for Embedded Systems: Hype or Lasting Impact? A Panel at ESWEEK 2017
Hu, X. Sharon
Univ Notre Dame, IN 46556 USA.
Ernst, Rolf
Tech Univ Brunswick, ME USA.
Eles, Petru Ion
Linköping University, Department of Computer and Information Science, Software and Systems. Linköping University, Faculty of Science & Engineering.
Heiser, Gernot
Univ New South Wales Sydney, Australia.
Keutzer, Kurt
Univ Calif Berkeley, CA 94720 USA.
Kim, Daehyun
Samsung, South Korea.
Tohdo, Tetsuya
DENSO CORP, Japan.
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2018 (English)
In:
IEEE design & test, ISSN 2168-2356, E-ISSN 2168-2364, Vol. 35, no 6, p. 86-93
Article in journal, Editorial material (Other academic) Published
Abstract [en]
n/a
Place, publisher, year, edition, pages
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC , 2018. Vol. 35, no 6, p. 86-93
National Category
Computer and Information Sciences
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URN:
urn:nbn:se:liu:diva-153538
DOI:
10.1109/MDAT.2018.2869988
ISI:
000452183600010
OAI: oai:DiVA.org:liu-153538
DiVA, id:
diva2:1273216
Available from:
2018-12-20
Created:
2018-12-20
Last updated:
2018-12-20
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ieee
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