liu.seSearch for publications in DiVA
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
A 230 mu W built-in on-chip auto-calibrating RF amplitude detector in 65 nm CMOS
Linköping University, Department of Electrical Engineering, Integrated Circuits and Systems. Linköping University, Faculty of Science & Engineering. Khalifa Univ Sci and Technol, U Arab Emirates.
Khalifa Univ Sci and Technol, U Arab Emirates; Wayne State Univ, MI 48202 USA.
Intel Corp, AZ USA.
SoC Ctr, U Arab Emirates.
Show others and affiliations
2019 (English)In: Analog Integrated Circuits and Signal Processing, ISSN 0925-1030, E-ISSN 1573-1979, Vol. 101, no 2, p. 175-185Article in journal (Refereed) Published
Abstract [en]

In this paper, a built-in-self-calibration RF amplitude detector circuit in 65 nm CMOS is presented. The proposed architecture makes use of two detector replicas with a feedback control system to perform the self-calibration. The system is capable of detecting RF peak amplitudes range of 0-0.6 V-p with a conversion gain of - 3 V/V. The proposed system has a wide dynamic range that can auto-corrects the RF detector to less than 10% across process and temperature variations. This architecture is implemented in standard 65 nm 1P7 M CMOS process. Comprehensive silicon measurement results show that the self-calibration structure improves the detection error of the non-calibrated RF amplitude detector by a maximum of 71% at only 230 mu W overall power consumption. The proposed system can be used to calibrate the variations in circuits within an RF transceiver such as LNA, Mixers, oscillators etc.

Place, publisher, year, edition, pages
SPRINGER , 2019. Vol. 101, no 2, p. 175-185
Keywords [en]
Amplitude detector; Built-in-self-test (BiST); Detection error; RF detector and variability compensation
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:liu:diva-161831DOI: 10.1007/s10470-019-01529-4ISI: 000491586500001OAI: oai:DiVA.org:liu-161831DiVA, id: diva2:1370912
Available from: 2019-11-18 Created: 2019-11-18 Last updated: 2019-11-18

Open Access in DiVA

No full text in DiVA

Other links

Publisher's full text

Search in DiVA

By author/editor
Kifle, Yonatan Habteslassie
By organisation
Integrated Circuits and SystemsFaculty of Science & Engineering
In the same journal
Analog Integrated Circuits and Signal Processing
Other Electrical Engineering, Electronic Engineering, Information Engineering

Search outside of DiVA

GoogleGoogle Scholar

doi
urn-nbn

Altmetric score

doi
urn-nbn
Total: 11 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf