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Stacking Faults in Silicon Carbide
Linköping University, Department of Physics, Measurement Technology, Biology and Chemistry. Linköping University, The Institute of Technology.
2003 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

This PhD thesis comprises a series of theoretical studies on various stacking faults in silicon carbide polytypes, based on first-principles density functional modelling, which lead to a detailed insight into general electronic properties of stacking disordered system. This work is largely motivated by the discovery in 1999 by ABB Corporate Research of the electronic degradation phenomenon in 4H-SiC p-i-n diodes. The p-i-n diodes gradually degraded in the sense that the voltage drop across the diode, for a constant current, increased gradually with the time of operation. More significantly, the timing of the electronic deterioration was correlated with the occurrence of structural defects, mainly interpreted as stacking faults in the basal planes. In the initial stage of our research, the primal purpose was to fulfil a logical gap: even if stacking faults are created in connection with diode degradation, are they the culprit for degradation? If not, eliminating stacking faults makes no sense. If they do cause degradation, how does it work? However, later on, we encountered the unexpected diverse nature of stacking faults in silicon carbide polytypes.

In paper I, we reported the discovery of localized electronic states around stacking faults in silicon carbide. It was found that certain types of stacking faults in 4H- and 6H-SiC can create very clear quantum-well-like structures. Additionally, all geometrically distinguishable intrinsic stacking faults in 3C-, 4H-, and 6H-SiC were recognized.

In paper II, the stacking fault energies for all the different stacking faults in 3C-, 4H-, and 6H-SiC as well as Si and diamond were determined.

In paper III, a detailed investigation of cubic inclusions in 4H-SiC was performed. Moreover, strong evidence for the rich occurrence of double-stacking fault structure in 4H-SiC was revealed.

In paper IV, it was found that a wide variety of electronic properties of stacking faults in 3C-, 4H-, 6H-, and 15R-SiC can actually be classified into three classes according to the dominant factors that determine their electronic properties:1. quantum-well class, 2. spontaneous-polarization class, and 3. electrically-inactive class.

In paper V, a microscopic model to account for the effect of the spontaneous polarization on the electronic structures of stacking faults was developed, as well as a convenient notation system to describe a variety of different stacking faults. Some analysis based on a simple rectangular quantum-well model was also done.

In paper VI, a theoretical investigation of stacking faults in 15R-SiC was reported. There are as many as five different stacking faults with different properties in this polytype.

In paper VII, multiple stacking faults in 6H-SiC were investigated, and some differences from those in 4H-SiC were discussed.

In paper VIII, effective masses for two-dimensional electron gases around stacking faults, which are actually very novel two-dimensional quantum structures, were calculated.

In paper IX, twin boundaries in 3C-SiC were studied in detail in comparison with those in Si and diamond, and we discovered that interacting twin boundaries which are separated by only two or three Si-C bilayers are actually favourable in energy.

Place, publisher, year, edition, pages
Linköping: Linköping University , 2003. , p. 55
Series
Linköping Studies in Science and Technology. Dissertations, ISSN 0345-7524 ; 817
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:liu:diva-179558Libris ID: 8885103ISBN: 9173736317 (print)OAI: oai:DiVA.org:liu-179558DiVA, id: diva2:1597199
Public defence
2003-04-30, sal J206 (Planck), Linköpings universitet, Linköping, 10:15
Opponent
Available from: 2021-09-24 Created: 2021-09-24 Last updated: 2023-02-28Bibliographically approved
List of papers
1. Localized electronic states around stacking faults in silicon carbide
Open this publication in new window or tab >>Localized electronic states around stacking faults in silicon carbide
2002 (English)In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 65, no 3Article in journal (Refereed) Published
Abstract [en]

We report on a first-principles study of all the structurally different stacking faults that can be introduced by elide along the (0001) basal plane in 3C-, 4H-, and 6H-SiC based on the local-density approximation within the density-functional theory. Our band-structure calculations have revealed that both types of stacking faults in 4H-SiC and two of the three different types of stacking faults in 6H-SiC give rise to quasi-two-dimensional energy band states in the band gap at around 0.2 eV below the lowest conduction band, thus being electrically active in n-type material. Although stacking faults, unlike point defects and surfaces, are not associated with broken or chemically perturbed bonds, we find a strong localization, within roughly 10-15 Angstrom perpendicular to the stacking fault plane, of the stacking fault gap state wave functions. We find that this quantum-well-like feature of certain stacking faults in SiC can be understood in terms of the large conduction-band offsets between the cubic and hexagonal polytypes. Recent experimental results give qualitative support to our results.

National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-47907 (URN)10.1103/PhysRevB.65.033203 (DOI)
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2021-09-24
2. Theoretical calculation of stacking fault energies in silicon carbide
Open this publication in new window or tab >>Theoretical calculation of stacking fault energies in silicon carbide
2002 (English)In: Materials Science Forum, ISSN 0255-5476, E-ISSN 1662-9752, Vol. 389-3, p. 439-442Article in journal (Refereed) Published
Abstract [en]

A first-principles calculation of stacking fault energies in 3C-, 4H-, and 6H-SiC, based on the local-density approximation within the density-functional theory, is reported. All the structurally different stacking faults which can be introduced by glide along the (0001) basal plane are considered. The number of such stacking faults in these polytypes is one, two, and three, respectively. The stacking fault energies are also calculated using the simpler generalized axial next-nearest-neighbor Ising (ANNNI) model. Our calculations confirm that the stacking fault energy of 3C-SiC is negative, and we also find that one of the three types of stacking faults in 6H-SiC has a considerably higher stacking fault energy than the other two types.

Keywords
first-principles calculations, stacking faults, stacking fault energy
National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-48806 (URN)
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2021-09-24
3. Cubic polytype inclusions in 4H-SiC
Open this publication in new window or tab >>Cubic polytype inclusions in 4H-SiC
2003 (English)In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 93, no 3, p. 1577-1585Article in journal (Refereed) Published
Abstract [en]

The multiple stacking faults in 4H-SiC, leading to narrow 3C polytype inclusions along the hexagonal c direction, were discussed. The stacking fault energies for successive stacking faults were calculated. The analysis showed that the stacking fault energy for the two stacking faults in adjacent basal planes was reduced by approximately a factor of 4 relative to that of one isolated stacking fault.

National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-46730 (URN)10.1063/1.1534376 (DOI)
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2021-09-24
4. Theoretical study of planar defects in silicon carbide
Open this publication in new window or tab >>Theoretical study of planar defects in silicon carbide
2002 (English)In: Journal of Physics: Condensed Matter, ISSN 0953-8984, E-ISSN 1361-648X, Vol. 14, no 48, p. 12733-12740Article in journal (Refereed) Published
Abstract [en]

We report on a theoretical investigation of extended planar defects in 3C-, 4H-, 6H-, and 15R-SiC which can be formed without breaking any bonds, covering a wide range of planar defects: twin boundaries, stacking faults, and polytype inclusions. Their electronic structures have been intensively studied using an ab initio supercell approach based on the density functional theory. Stacking fault energies are also calculated using both the supercell method and the axial next-nearest-neighbour Ising model. We discuss the electronic properties and energies of these defects in terms of the geometrical differences of stacking patterns.

National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-46782 (URN)10.1088/0953-8984/14/48/310 (DOI)
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2021-09-24
5. Stacking faults in 3C-, 4H-, and 6H-SiC polytypes investigated by an ab initio supercell method
Open this publication in new window or tab >>Stacking faults in 3C-, 4H-, and 6H-SiC polytypes investigated by an ab initio supercell method
2003 (English)In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 67, no 15Article in journal (Refereed) Published
Abstract [en]

Recent attempts to make SiC diodes have revealed a problem with stacking fault expansion in the material, leading to unstable devices. In this paper, we present detailed results from a density-functional supercell calculation on the electronic structure of stacking faults which result from glide of Shockley partials in 3C-, 4H- and 6H-SiC. It was found [Phys. Rev. B 65, 033203 (2002)] that both types of stacking faults in 4H-SiC and two types of stacking faults in 6H-SiC give rise to band states, which are strongly localized (confined within around 10 Angstrom) in the direction orthogonal to the stacking fault plane. Based on estimates of the band offsets between different polytypes and a simple quantum-well theory, we show that it is possible to interpret this one-dimensional localization as a quantum-well confinement effect. We also find that the third type of stacking fault in 6H-SiC and the only stacking fault in 3C-SiC do not give rise to states clearly separated from the band edges, but instead give rise to rather strongly localized band states with energies very close to the band edges. We argue that these localized near band edge states are created by stacking fault induced changes in the dipole moment associated with the hexagonal symmetry. In addition, we have also calculated the stacking fault energies, using both the supercell method and the simpler ANNNI (axial next nearest-neighbor Ising) model. Both theories agree well with the low stacking fault energies found experimentally.

National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-47803 (URN)10.1103/PhysRevB.67.155204 (DOI)
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2021-09-24
6. Electronic properties of stacking faults in 15R-SiC
Open this publication in new window or tab >>Electronic properties of stacking faults in 15R-SiC
2002 (English)In: Materials Science Forum, ISSN 0255-5476, E-ISSN 1662-9752, Vol. 433-4, p. 531-534Article in journal (Refereed) Published
Abstract [en]

A first-principles calculation of stacking faults in 15R-SiC is reported. All the geometrically distinguishable stacking faults which can be introduced by the glide of partial dislocations in (0001)-basal planes are investigated: there exist as many as five different stacking faults in 15R-SiC. Electronic properties and stacking fault energies of these extended defects are studied based on the density functional theory in the local density approximation. Stacking fault energies are also calculated using the axial next nearest neighbor Ising (ANNNI) model.

Keywords
15R-SiC, extended defects, first-principles calculations, stacking faults
National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-48553 (URN)
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2021-09-24
7. Ab initio study of 3 C inclusions and stacking fault-stacking fault interactions in 6H-SiC
Open this publication in new window or tab >>Ab initio study of 3 C inclusions and stacking fault-stacking fault interactions in 6H-SiC
2003 (English)In: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 94, no 8, p. 4972-4979Article in journal (Refereed) Published
Abstract [en]

A ab initio study of 3 C inclusions and stacking fault-stacking fault interactions in 6H-SiC was presented. The electronic structures and the total energies of 6H-SiC single crystals that contain one, two, three and four stacking faults were studied. The possibility of local hexagonal to cubic polytypic transformations was discussed in light of the formation energy and quantum-well action.

National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-46458 (URN)10.1063/1.1610772 (DOI)
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2021-09-24
8. Effective masses of two-dimensional electron gases around cubic inclusions in hexagonal silicon carbide
Open this publication in new window or tab >>Effective masses of two-dimensional electron gases around cubic inclusions in hexagonal silicon carbide
2003 (English)In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 68, no 24Article in journal (Refereed) Published
Abstract [en]

The main purpose of this article is to determine the two-dimensional effective mass tensors of electrons confined in thin 3C wells in hexagonal SiC, which is a first step in the understanding of in-plane electron motion in the novel quantum structures. We have performed ab initio band structure calculations, based on the density functional theory in the local density approximation, for single and multiple stacking faults leading to thin 3C-like regions in 4H- and 6H-SiC and deduced electron effective masses for two-dimensional electron gases around the cubic inclusions. We have found that electrons confined in the thin 3C-like layers have clearly heavier effective masses than in the perfect bulk 3C-SiC single crystal.

National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-46293 (URN)10.1103/PhysRevB.68.245309 (DOI)
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2021-09-24
9. Energies and electronic properties of isolated and interacting twin boundaries in 3C-SiC, Si, and diamond
Open this publication in new window or tab >>Energies and electronic properties of isolated and interacting twin boundaries in 3C-SiC, Si, and diamond
2003 (English)In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 68, no 11Article in journal (Refereed) Published
Abstract [en]

First-principles calculations of twin boundaries in 3C-SiC, Si, and diamond are performed, based on the density-functional theory in the local density approximation. We have investigated the formation energies and electronic properties of isolated and interacting twin boundaries. It is found that in 3C-SiC, interacting twin boundaries which are separated by more than two Si-C bilayers are actually energetically more favorable, implying a relatively frequent appearance of these defects. The effect of the spontaneous polarization associated with the hexagonal symmetry around twin boundaries is also studied, and we have observed that the wave functions belonging to the conduction- and valence-band edge states in 3C-SiC tend to be localized almost exclusively on different sides of the faulted layers, while there is no such feature in Si or diamond.

National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-47753 (URN)10.1103/PhysRevB.68.113202 (DOI)
Available from: 2009-10-11 Created: 2009-10-11 Last updated: 2021-09-24

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