A Mueller matrix spectroscopic ellipsometry approach was used to investigate the anisotropic dielectric constants of corundum alpha-(AlxGa1-x)(2)O-3 thin films in their below bandgap spectral regions. The sample set was epitaxially grown using plasma-assisted molecular beam epitaxy on m-plane sapphire. The spectroscopic ellipsometry measurements were performed at multiple azimuthal angles to resolve the uniaxial dielectric properties. A Cauchy dispersion model was applied, and high-frequency dielectric constants are determined for polarization perpendicular (epsilon(infinity,perpendicular to)) and parallel (epsilon(infinity,parallel to)) to the thin film c-axis. The optical birefringence is negative throughout the composition range, and the overall index of refraction substantially decreases upon incorporation of Al. We find small bowing parameters of the highfrequency dielectric constants with b(perpendicular to) = 0:386 and b(parallel to) = 0:307. Published under an exclusive license by AIP Publishing.