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Large Signal Physical Simulations of Si LD-MOS transistor for RF application
Linköping University, The Department of Physics, Chemistry and Biology.
2004 (English)Independent thesis Basic level (professional degree)Student thesis
Abstract [en]

The development of computer aided design tools for devices and circuits has increased the interest for accurate transistor modeling in microwave applications. In the increasingly expanding wireless communication market, there is a huge demand for high performance RF power devices. The silicon LD- MOSFET transistor is dueto its high power performance is today widely used in systems such as mobile base stations, private branch exchanges (PBX), and local area networks (LAN) utilizing the bands between 0.9 to 2.5 GHz.

In this research we simulated LD-MOSFET transistor characteristics of the structure provided by Infineon technology at Kista, Stockholm. The maximum drain current obtained in the simulation was 400 mA at a gate voltage of 8 V. This value is somewhat higher than the measured one. This difference can be attributed to the parasitic effects since no parasitic effects were included in the simulations in the beginning. The only parasitic effect studied was by placing the source contact at the bottom of the substrate according to real commercial device. The matching between simulated and measured results were improved and maximum drain current was reduced to 300 mA/mm which was 30% higher than the measured drain current

The large signal RF simulations were performed in time-domain in our novel technique developed at LiU. This technique utilizes a very simple amplifier circuit without any passive components. Only DC bias and RF signals are applied to the gate and drain terminals, with the same fundamental frequency but with 180o phase difference. The RF signal at the drain acting as a short at higher harmonics. These signals thus also acted as an active match to the transistor. Large signal RF simulations were performed at 1, 2 and 3 GHz respectively. The maximum of drain current signal was observed at the maximum of drain voltage signal indicating the normal behavior of the transistor. At 1 GHz the output power was 1.25 W/mm with 63% of drain efficiency and 23.7 dB of gain. The out pout power was decreased to 1.15 W/mm and 1.1 W/mm at 2 and 3 GHz respectively at the same time the efficiency and gain was also decreased to 57% and 19 dB at 2 GHz and 51% and 15 dB at 3GHz respectively.

Place, publisher, year, edition, pages
Institutionen för fysik, kemi och biologi , 2004.
Keyword [en]
Physics, Si-LDMOS, TCAD-Simulation, Large Signal, RF power transistor
Keyword [sv]
National Category
Physical Sciences
URN: urn:nbn:se:liu:diva-2627ISRN: LITH-IFM-EX--04/1333--SEOAI: diva2:19963
Available from: 2005-02-23 Created: 2005-02-23

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