liu.seSearch for publications in DiVA
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Hybrid Built-In Self-Test and Test Generation Techniques for Digital Systems
Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory. Linköping University, The Institute of Technology.
2005 (English)Doctoral thesis, monograph (Other academic)
Abstract [en]

The technological development is enabling the production of increasingly complex electronic systems. All such systems must be verified and tested to guarantee their correct behavior. As the complexity grows, testing has become one of the most significant factors that contribute to the total development cost. In recent years, we have also witnessed the inadequacy of the established testing methods, most of which are based on low-level representations of the hardware circuits. Therefore, more work has to be done at abstraction levels higher than the classical gate and register-transfer levels. At the same time, the automatic test equipment based solutions have failed to deliver the required test quality. As a result, alternative testing methods have been studied, which has led to the development of built-in self-test (BIST) techniques.

In this thesis, we present a novel hybrid BIST technique that addresses several areas where classical BIST methods have shortcomings. The technique makes use of both pseudorandom and deterministic testing methods, and is devised in particular for testing modern systems-on-chip. One of the main contributions of this thesis is a set of optimization methods to reduce the hybrid test cost while not sacrificing test quality. We have devel oped several optimization algorithms for different hybrid BIST architectures and design constraints. In addition, we have developed hybrid BIST scheduling methods for an abort-on-first-fail strategy, and proposed a method for energy reduction for hybrid BIST.

Devising an efficient BIST approach requires different design modifications, such as insertion of scan paths as well as test pattern generators and signature analyzers. These modifications require careful testability analysis of the original design. In the latter part of this thesis, we propose a novel hierarchical test generation algorithm that can be used not only for manufacturing tests but also for testability analysis. We have also investigated the possibilities of generating test vectors at the early stages of the design cycle, starting directly from the behavioral description and with limited knowledge about the final implementation.

Experiments, based on benchmark examples and industrial designs, have been carried out to demonstrate the usefulness and efficiency of the proposed methodologies and techniques.

Place, publisher, year, edition, pages
Institutionen för datavetenskap , 2005. , 255 p.
Series
Linköping Studies in Science and Technology. Dissertations, ISSN 0345-7524 ; 945
Keyword [en]
Datavetenskap, system-on-chip, test generation, BIST, hybrid BIST, high-level test
Keyword [sv]
Datavetenskap
National Category
Computer Science
Identifiers
URN: urn:nbn:se:liu:diva-2994ISBN: 91-85297-97-6 (print)OAI: oai:DiVA.org:liu-2994DiVA: diva2:20335
Public defence
2005-05-20, 13:15 (English)
Supervisors
Available from: 2005-07-19 Created: 2005-07-19 Last updated: 2009-05-20

Open Access in DiVA

fulltext(1796 kB)1357 downloads
File information
File name FULLTEXT01.pdfFile size 1796 kBChecksum MD5
52c670b284e358929d475c95d1c861d1f7cf642395e08a28b5a7d82d3439a363455c3863
Type fulltextMimetype application/pdf

Other links

Link to Licentiate Thesis

Authority records BETA

Jervan, Gert

Search in DiVA

By author/editor
Jervan, Gert
By organisation
ESLAB - Embedded Systems LaboratoryThe Institute of Technology
Computer Science

Search outside of DiVA

GoogleGoogle Scholar
Total: 1357 downloads
The number of downloads is the sum of all downloads of full texts. It may include eg previous versions that are now no longer available

isbn
urn-nbn

Altmetric score

isbn
urn-nbn
Total: 2896 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf