Resonant Inelastic X-Ray Scattering at the Oxygen K Resonance of NiO: Nonlocal Charge Transfer and Double-Singlet Excitations
2006 (English)In: Physical Review Letters, ISSN 0031-9007, Vol. 96, no 067402Article in journal (Refereed) Published
We report high-resolution polarization-dependent resonant inelastic x-ray scattering (RIXS) at the O K resonance of NiO showing a rich excitation spectrum. We perform multisite Ni6O19 cluster model calculations, revealing that solid state effects are substantial. We identify a nonlocal charge transfer excitation at 4–5 eV and double-singlet creation at 1.75 eV, both exhibiting significant scattering geometry dependence. Apart from an intense band of local charge transfer excitations (above 5 eV) also dd excitations at 1 eV are observed. Finally, we point out that O K RIXS of correlated metal oxides allows a quantitative and consistent determination of the charge transfer energy and the Hund coupling energy JH.
Place, publisher, year, edition, pages
2006. Vol. 96, no 067402
nickel compounds, X-ray scattering, charge transfer states
IdentifiersURN: urn:nbn:se:liu:diva-17408DOI: 10.1103/PhysRevLett.96.067402OAI: oai:DiVA.org:liu-17408DiVA: diva2:209018
Original Publication:L.-C. Duda, T. Schmitt, Martin Magnuson, J. Forsberg, A. Olsson, J. Nordgren, K. Okada and A. Kotani, Resonant Inelastic X-Ray Scattering at the Oxygen K Resonance of NiO: Nonlocal Charge Transfer and Double-Singlet Excitations, 2006, Physical Review Letters, (96), 067402.http://dx.doi.org/10.1103/PhysRevLett.96.067402Copyright: American Physical Societyhttp://www.aps.org/2009-03-232009-03-232013-10-02Bibliographically approved