Microstructural characterization of the tool-chip interface enabled by focused ion beam and analytical electron microscopy
2009 (English)In: WEAR, ISSN 0043-1648, Vol. 266, no 11-12, 1237-1240 p.Article in journal (Refereed) Published
A method based on focused ion beam milling and analytical electron microscopy to investigate the nature of the tool-chip interface is presented. It is employed to study tool-chip interfaces of the rake face of a (Ti0.83Si0.17)N coated PCBN insert after turning of case-hardened steel. Analytical electron microscopy shows the presence of a smeared adhered layer on the coating, which consists of steel elements from the work-piece, oxygen, and Si and N, most likely originating from the coating.
Place, publisher, year, edition, pages
2009. Vol. 266, no 11-12, 1237-1240 p.
Cutting tool, TiSiN, TEM, FIB, Microstructure, Hard coating, PCBN
IdentifiersURN: urn:nbn:se:liu:diva-19529DOI: 10.1016/j.wear.2009.03.001OAI: oai:DiVA.org:liu-19529DiVA: diva2:225741
Axel Flink, R M Saoubi, Finn Giuliani, J Sjolen, T Larsson, Per Persson, M P Johansson and Lars Hultman, Microstructural characterization of the tool-chip interface enabled by focused ion beam and analytical electron microscopy, 2009, WEAR, (266), 11-12, 1237-1240.
Copyright: Elsevier Science B.V., Amsterdam.