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Microstructural characterization of the tool-chip interface enabled by focused ion beam and analytical electron microscopy
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology.
Seco Tools AB.
Linköping University, Department of Physics, Chemistry and Biology. Linköping University, The Institute of Technology.
Seco Tools AB.
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2009 (English)In: WEAR, ISSN 0043-1648, Vol. 266, no 11-12, 1237-1240 p.Article in journal (Refereed) Published
Abstract [en]

A method based on focused ion beam milling and analytical electron microscopy to investigate the nature of the tool-chip interface is presented. It is employed to study tool-chip interfaces of the rake face of a (Ti0.83Si0.17)N coated PCBN insert after turning of case-hardened steel. Analytical electron microscopy shows the presence of a smeared adhered layer on the coating, which consists of steel elements from the work-piece, oxygen, and Si and N, most likely originating from the coating.

Place, publisher, year, edition, pages
2009. Vol. 266, no 11-12, 1237-1240 p.
Keyword [en]
Cutting tool, TiSiN, TEM, FIB, Microstructure, Hard coating, PCBN
National Category
Natural Sciences
Identifiers
URN: urn:nbn:se:liu:diva-19529DOI: 10.1016/j.wear.2009.03.001OAI: oai:DiVA.org:liu-19529DiVA: diva2:225741
Note
Original Publication: Axel Flink, R M Saoubi, Finn Giuliani, J Sjolen, T Larsson, Per Persson, M P Johansson and Lars Hultman, Microstructural characterization of the tool-chip interface enabled by focused ion beam and analytical electron microscopy, 2009, WEAR, (266), 11-12, 1237-1240. http://dx.doi.org/10.1016/j.wear.2009.03.001 Copyright: Elsevier Science B.V., Amsterdam. http://www.elsevier.com/ Available from: 2009-07-08 Created: 2009-06-26 Last updated: 2016-08-31Bibliographically approved

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Flink, AxelGiuliani, FinnPersson, PerHultman, Lars

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