Programmable reference generator for on-chip measurement
2006 (English)In: Proc. 24th IEEE Norchip Conf., NORCHIP'06, 2006, 89-92 p.Conference paper (Refereed)
In this work, circuits for on-chip measurement and periodic waveform capture are designed. The aim is to analyze disturbances in mixed-signal chips such as simultaneous switching noise and the transfer of substrate noise. A programmable reference generator that replaces the standard digital-to-analog converter is proposed. It is based on a resistor string that is connected in a circular structure. A feature is that the reference outputs to the different comparators in the measurement channels are distributed over the nodes of the resistor string. Comparing with using a complete digital-to-analog converter, the use of a buffer is avoided. Hence, there is a potential reduction in the parasitic capacitance and power consumption as well as an increase in speed. We present results from a test chip demonstrating that simultaneous switching noise can be measured with the presented approach.
Place, publisher, year, edition, pages
2006. 89-92 p.
comparators, digital-analog conversion, electric noise measurement, integrated circuit measurement, integrated circuit noise, programmable circuits, reference circuits
Other Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:liu:diva-14448DOI: 10.1109/NORCHP.2006.329251ISBN: 1-4244-0772-9OAI: oai:DiVA.org:liu-14448DiVA: diva2:23517