On-chip Stimuli Generation for ADC Dynamic Test by ΣΔ Technique
2009 (English)In: Proceedings in European Conference on Circuit Theory and Design 2009 (ECCTD´09), Antalya, Turkey, IEEE , 2009, 105-108 p.Conference paper (Refereed)
This paper presents application of the ΣΔ modulation technique to the on-chip dynamic test for A/D converters. The wanted stimulus such as a single- or two-tone signal is encoded into one-bit ΣΔ sequence, which after simple low-pass filtering is applied to the circuit under test with low noise and without distortion. In this way a large dynamic range is achieved making the performance harmonic- and intermodulation dynamic test viable. By a systematic approach we select the order and type of a ΣΔ modulator, and develop the frequency plan suitable for spectral measurements on a chip. The technique is illustrated by simulation of a practical ADC under test.
Place, publisher, year, edition, pages
IEEE , 2009. 105-108 p.
Stimuli generation, on-chip test
Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:liu:diva-20668DOI: 10.1109/ECCTD.2009.5274977ISI: 000276473700027ISBN: 978-1-4244-3896-9OAI: oai:DiVA.org:liu-20668DiVA: diva2:235483
European Conference on Circuit Theory and Design, ECCTD 2009, 23-27 Aug., Antalya
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