Light Induced Damage in Poly(3,4-ethylenedioxythiophene) and its Derivatives Studied by Photoelectron Spectroscopy
2004 (English)In: Synthetic metals, ISSN 0379-6779, Vol. 141, no 1-2, 67-73 p.Article in journal (Refereed) Published
Poly(3,4-ethylenedioxythiophene), usually known as PEDOT, and derivatives have attracted significant interest because of their high electrical conductivity. This electric property, however, deteriorates upon exposure to solar radiation. X-ray photoelectron spectroscopy (XPS) has been used to study the UV-light-induced chemical changes in doped PEDOT, as well as in both neutral and doped forms of its alkylated derivative—PEDOT-C14H29. Analysis of the XPS data indicates an oxidation of the sulfur in the thiophene ring. Apparently, photo-oxidation leads to the formation of sulfon groups, SO2, resulting in a disruption of π-conjugation in PEDOT, which there by diminishes the conductivity of the organic layer. This hypothesis is supported by the results of a study of model molecules for pristine and the oxidized PEDOT unit: 3,4 ethylenedioxythiophene (EDOT) and 3,4 ethylenedioxythiophene and S-dioxide (EDOT-SO2), respectively.
Place, publisher, year, edition, pages
Elsevier, 2004. Vol. 141, no 1-2, 67-73 p.
Poly(3, 4-ethylenedioxythiophene), X-ray photoelectron spectroscopy, Degradation, Photo-oxidation, Sulfon
IdentifiersURN: urn:nbn:se:liu:diva-14580DOI: 10.1016/j.synthmet.2003.08.017ISI: 000220273400012OAI: oai:DiVA.org:liu-14580DiVA: diva2:23941