Conductivity, Morphology, Interfacial Chemistry, and Stability of Poly(3,4- ethylene dioxythiophene)–Poly(styrene sulfonate): A Photoelectron Spectroscopy Study
2003 (English)In: Journal of Polymer Science Part B: Polymer Physics, ISSN 0887-6266, E-ISSN 1099-0488, Vol. 41, no 21, 2561-2583 p.Article, book review (Other academic) Published
X-ray photoelectron spectroscopy (XPS) has been used to characterize poly(3,4-ethylene dioxythiophene)-poly(styrene sulfonate) (PEDT/PSS), one of the most common electrically conducting organic polymers. A correlation has been established between the composition, morphology, and polymerization mechanism, on the one hand, and the electric conductivity of PEDT/PSS, on the other hand. XPS has been used to identify interfacial reactions occurring at the polymer-on-ITO and polymer-on-glass interfaces, as well as chemical changes within the polymer blend induced by electrical stress and exposure to ultraviolet light.
Place, publisher, year, edition, pages
John Wiley & Sons, 2003. Vol. 41, no 21, 2561-2583 p.
ESCA/XPS, poly(3, 4-ethylene dioxythiophene), conductivity, degradation, interfacial chemistry, conducting polymers
National CategoryPolymer Chemistry Polymer Technologies
IdentifiersURN: urn:nbn:se:liu:diva-14581DOI: 10.1002/polb.10659ISI: 000185967300009OAI: oai:DiVA.org:liu-14581DiVA: diva2:23942