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Surface morphology, structural and optical properties of polar and non-polar ZnO thin films: A comparative study
Jilin University.
Jilin University.
Changchun Institute of Optics.
Changchun Institute of Optics.
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2009 (English)In: Journal of Crystal Growth, ISSN 0022-0248, Vol. 311, no 19, 4398-4401 p.Article in journal (Refereed) Published
Abstract [en]

The polar and non-polar ZnO thin films were fabricated on cubic MgO (1 1 1) and (0 0 1) substrates by plasma-assisted molecular beam epitaxy. Based on X-ray diffraction analysis, the ZnO thin films grown on MgO (1 1 1) and (1 0 0) substrates exhibit the polar c-plane and non-polar m-plane orientation, respectively. Comparing with the c-plane ZnO film, the non-polar m-plane ZnO film shows cross-hatched stripes-like morphology, lower surface roughness and slower growth rate. However, low-temperature photoluminescence measurement indicates the m-plane ZnO film has a stronger 3.31 eV emission, which is considered to be related to stacking faults. Meanwhile, stronger band tails absorbance of the m-plane ZnO film is observed in optical absorption spectrum.

Place, publisher, year, edition, pages
2009. Vol. 311, no 19, 4398-4401 p.
Keyword [en]
A1. Atomic force microscopy; A1. X-ray diffraction; A3. Molecular beam epitaxy; Al. Photoluminescence; B1. Zinc oxide
National Category
Engineering and Technology
URN: urn:nbn:se:liu:diva-21209DOI: 10.1016/j.jcrysgro.2009.07.043OAI: diva2:240918
Available from: 2009-09-30 Created: 2009-09-30 Last updated: 2009-09-30

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ReferencesLink to record
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