Equipment for measuring cosmic-ray effects on DRAM
Independent thesis Advanced level (degree of Magister), 20 points / 30 hpStudent thesis
Nuclear particles hitting the silicon in a electronic device can cause a change in the data in a memory bit cell or in a flip-flop. The device is still working, but the data is corrupted and this is called a soft error. A soft error caused by a single nuclear particle is called a single event upset and is a growing problem. Research is ongoing at Saab aiming at how susceptible random access memories are to protons and neutrons.
This thesis describes the development of equipment for measuring cosmic-ray effects on DRAM in laboratories. The system is built on existing hardware with a FPGA as the core unit. A short history of soft errors is also given and what causes it. How a DRAM works and basic operation is explained and the difference between a SRAM. The result is a working system ready to be used.
Place, publisher, year, edition, pages
Institutionen för systemteknik , 2007. , 53 p.
DRAM, memory, SEU, single event upset, soft error, FPGA, cosmic radiation
Other Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:liu:diva-9764ISRN: LiTH-ISY-EX--07/4031--SEOAI: oai:DiVA.org:liu-9764DiVA: diva2:24143
2007-08-30, Nollstället, B-huset, Linköping, 10:00