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Equipment for measuring cosmic-ray effects on DRAM
Linköping University, Department of Electrical Engineering.
2007 (English)Independent thesis Advanced level (degree of Magister), 20 points / 30 hpStudent thesis
Abstract [en]

Nuclear particles hitting the silicon in a electronic device can cause a change in the data in a memory bit cell or in a flip-flop. The device is still working, but the data is corrupted and this is called a soft error. A soft error caused by a single nuclear particle is called a single event upset and is a growing problem. Research is ongoing at Saab aiming at how susceptible random access memories are to protons and neutrons.

This thesis describes the development of equipment for measuring cosmic-ray effects on DRAM in laboratories. The system is built on existing hardware with a FPGA as the core unit. A short history of soft errors is also given and what causes it. How a DRAM works and basic operation is explained and the difference between a SRAM. The result is a working system ready to be used.

Place, publisher, year, edition, pages
Institutionen för systemteknik , 2007. , 53 p.
Keyword [en]
DRAM, memory, SEU, single event upset, soft error, FPGA, cosmic radiation
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:liu:diva-9764ISRN: LiTH-ISY-EX--07/4031--SEOAI: oai:DiVA.org:liu-9764DiVA: diva2:24143
Presentation
2007-08-30, Nollstället, B-huset, Linköping, 10:00
Uppsok
teknik
Supervisors
Examiners
Available from: 2007-09-14 Created: 2007-09-14

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CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf