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Test Quality Analysis and Improvement for an Embedded Asynchronous FIFO
Linköping University, Department of Computer and Information Science.
2007 (English)Independent thesis Basic level (professional degree), 20 points / 30 hpStudent thesis
Abstract [en]

NXP Semiconductors (formerly Philips Semiconductors) has created a new embedded asynchronous FIFO module. It is a small and fast full-custom design with Design-for-Test (DfT) functionality. The fault detection qualities of a proposed manufacturing test for this FIFO have been analyzed by a defect-based method based on analog simulation. Resistive bridges and opens of different sizes in the bit-cell matrix and in the asynchronous control have been investigated.

The fault coverage for bridge defects in the bit-cell matrix of the initial FIFO test has been improved by inclusion of an additional data background and low-voltage testing. 100% fault coverage is reached for low resistance bridges. The fault coverage for opens has been improved by a new test procedure including waiting periods.

98.4% of the hard bridge defects in the asynchronous control slices can be detected with some modifications of the initial test.

Place, publisher, year, edition, pages
Institutionen för datavetenskap , 2007. , 68 p.
Keyword [en]
FIFO Testing, FIFO, Testing, Defect-Based Testing, Electronics
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:liu:diva-9942ISRN: LITH-IDA/DS-EX--07/002--SEOAI: oai:DiVA.org:liu-9942DiVA: diva2:24236
Uppsok
teknik
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Available from: 2007-10-03 Created: 2007-10-03

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CiteExportLink to record
Permanent link

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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf