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Signal path sensitization for built-in-self-test in integrated RF transceivers.
Linköping University, The Institute of Technology. Linköping University, Department of Electrical Engineering, Electronic Devices.
EK, ISY, LiU.
2004 (English)In: DDECS,2004, Bratislava: Institute of Informatics, SAS , 2004, 59- p.Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
Bratislava: Institute of Informatics, SAS , 2004. 59- p.
Keyword [en]
RF test, BiST, Built in Self-Test, Integrated RF Transceiver, Defect oriented test
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-22512Local ID: 1771OAI: oai:DiVA.org:liu-22512DiVA: diva2:242825
Available from: 2009-10-07 Created: 2009-10-07

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Dabrowski, Jerzy

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
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