liu.seSearch for publications in DiVA
Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Techniques for Sensitizing RF Path under SER Test.
Linköping University, The Institute of Technology. Linköping University, Department of Electrical Engineering, Electronic Devices.
2005 (English)In: ISCAS,2005, Galena, Il, USA: Gerard Enteprises, LLC , 2005, 4843- p.Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
Galena, Il, USA: Gerard Enteprises, LLC , 2005. 4843- p.
Keyword [en]
RF test, SER test, DfT, test pattern generation (TPG)
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-22621Local ID: 1901OAI: oai:DiVA.org:liu-22621DiVA: diva2:242934
Available from: 2009-10-07 Created: 2009-10-07

Open Access in DiVA

No full text

Authority records BETA

Dabrowski, Jerzy

Search in DiVA

By author/editor
Dabrowski, Jerzy
By organisation
The Institute of TechnologyElectronic Devices
Engineering and Technology

Search outside of DiVA

GoogleGoogle Scholar

urn-nbn

Altmetric score

urn-nbn
Total: 86 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf