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Elimination of quantization effects in measured temporal noise
Linköping University, Department of Electrical Engineering, Electronic Devices. Linköping University, The Institute of Technology.
2004 (English)In: Proceedings of the 2004 International Symposium on Circuits and Systems, 2004. ISCAS '04, Piscataway: IEEE Corp. , 2004, 932-935 p.Conference paper, Published paper (Refereed)
Abstract [en]

This paper presents a mathematical analysis of how temporal noise is transformed by quantization. A new method for measuring temporal noise with a low-resolution ADC and then accurately refer it back to the input of the ADC is shown. The method is, for instance, applicable to CMOS image sensors where photon shot noise is commonly used for determining conversion gain and quantum efficiency. Experimental tests have been carried out using a custom designed CMOS image sensor with an on-chip ADC featuring programmable gain and offset. The measurements verify the analysis and the method, e.g. noise levels of 0.11 LSB was measured with an accuracy 30 times higher than a traditional method would give.

Place, publisher, year, edition, pages
Piscataway: IEEE Corp. , 2004. 932-935 p.
National Category
Engineering and Technology
Identifiers
URN: urn:nbn:se:liu:diva-22821DOI: 10.1109/ISCAS.2004.1329158Local ID: 2159ISBN: 0-7803-8251-X (print)OAI: oai:DiVA.org:liu-22821DiVA: diva2:243134
Note

Received the Sensory Systems track Best Paper Award.

Available from: 2009-10-07 Created: 2009-10-07 Last updated: 2013-10-31
In thesis
1. Topics on CMOS Image Sensors
Open this publication in new window or tab >>Topics on CMOS Image Sensors
2005 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

Today there exist several applications where a real visible scene needs to be sampled to electrical signals, e.g., video cameras, digital still cameras, and machine vision systems. Since the 1970's charge-coupled device (CCD) sensors have primarily been used for this task, but during the last decade CMOS image sensors have become more and more popular. The demand for image sensors has lately grown very rapidly due to the increased market for, e.g., digital still cameras and the integration of image sensors in mobile phones.

The first out of three included papers presents a programmable multiresolution machine vision sensor with on-chip image processing capabilities. The sensor comprises an innovative multiresolution sensing area, 1536 ND converters, and a SIMD array of 1536 bit-serial processors with corresponding memory. The SIMD processor array can deliver more than 100 GOPS sustained and the onchip pixel-analyzing rate can be as high as 4 Gpixels/s. The sensor is intended for high-speed multisense imaging where, e.g., color, greyscale, internal material light scatter, and 3-D profiles are captured simultaneously. Experimental results showing very good image characteristics and a good digital to analog noise isolation are presented.

The second paper presents a mathematical analysis of how temporal noise is transformed by quantization. A new method for measuring temporal noise with a low-resolution ADC and then accurately refer it back to the input of the ADC is shown. The method is, for instance, applicable to CMOS image sensors where photon shot noise is commonly used for determining conversion gain and quantum efficiency. Experimental tests have been carried out using the above mentioned sensor, which has an on-chip ADC featuring programmable gain and offset. The measurements verify the analysis and the method.

The third paper presents a new column parallel ADC architecture, named simultaneous multislope, suitable for array implementations in, e.g., CMOS image sensors. The simplest implementation of the suggested architecture is almost twice as fast as a conventional slope ADC, while it requires only a small amount of extra circuitry. Measurements have been performed using the above mentioned sensor, which implements parts of the proposed ADC. The measurements show good linearity and verify the concept of the new architecture.

Place, publisher, year, edition, pages
Linköping: Linköpings universitet, 2005. 75 p.
Series
Linköping Studies in Science and Technology. Thesis, ISSN 0280-7971 ; 1182
National Category
Engineering and Technology
Identifiers
urn:nbn:se:liu:diva-22627 (URN)1907 (Local ID)91-85299-91-x (ISBN)1907 (Archive number)1907 (OAI)
Public defence
2005-08-26, Glashuset, Linköpings universitet, Linköping, 13:15 (Swedish)
Opponent
Available from: 2009-10-07 Created: 2009-10-07 Last updated: 2013-10-31

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Lindgren, Leif

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