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Hybrid BIST Test Scheduling Based on Defect Probabilities
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
2004 (English)In: 2004 IEEE Asian Test Symposium ATS 2004,2004, Kenting, Taiwan: IEEE Computer Society Press , 2004, 230- p.Conference paper, Published paper (Refereed)
Abstract [en]

This paper describes a heuristic for system-on-chip test scheduling in an abort-on-fail context, where the test is terminated as soon as a defect is detected. We consider an hybrid BIST architecture, where a test set is assembled from pseudorandom and deterministic test patterns. We take into account defect probabilities of individual cores in order to schedule the tests so that the expected total test time in the abort-on fail environment is minimized. Different from previous approaches, our hybrid BIST based approach enables us not only to schedule the tests but also to modify the internal test composition, the order and ratio of pseudorandom and deterministic test patterns, in order to reduce the expected total test time. Experimental results have shown the efficiency of the proposed heuristic to find good quality solutions with low computational overhead.

Place, publisher, year, edition, pages
Kenting, Taiwan: IEEE Computer Society Press , 2004. 230- p.
Keyword [en]
BIST, testing, defect probabilities, scheduling
National Category
Computer Science
Identifiers
URN: urn:nbn:se:liu:diva-23195DOI: 10.1109/ATS.2004.49Local ID: 2606ISBN: 0-7695-2235-1 (print)OAI: oai:DiVA.org:liu-23195DiVA: diva2:243509
Conference
2004 IEEE Asian Test Symposium ATS 2004
Available from: 2009-10-07 Created: 2009-10-07 Last updated: 2013-08-16

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Publisher's full texthttp://www.ida.liu.se/labs/eslab/publications/pap/db/ats04_hans.pdf

Authority records BETA

He, ZhiyuanJervan, GertPeng, ZeboEles, Petru Ion

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He, ZhiyuanJervan, GertPeng, ZeboEles, Petru Ion
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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
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  • Other style
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  • de-DE
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