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A Wiring-Aware Approach to Minimizing Built-In Self-Test Overhead
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
2004 (English)In: The IEEE International Workshop on Electronic Design, Test and Applications DELTA 2004,2004, 2004, 413-415 p.Conference paper, Published paper (Refereed)
Abstract [en]

This paper describes a built-in self-test hardware overhead minimization technique used during a BIST synthesis process. The technique inserts a minimal amount of BIST resources into a digital system to make it fully testable. The BIST resource insertion is guided by the results of symbolic testability analysis. It considers both BIST register cost and wiring overhead in order to obtain the minimal area designs. A Simulated Annealing algorithm is used to solve the overhead minimization problem. Experiments show that considering wiring area during BIST synthesis results in smaller final designs as compared to the cases when the wiring impact is ignored.

Place, publisher, year, edition, pages
2004. 413-415 p.
Keyword [en]
BIST, design for testability, wiring overhead, testing
National Category
Computer Science
Identifiers
URN: urn:nbn:se:liu:diva-23293DOI: 10.1109/DELTA.2004.10073Local ID: 2719ISBN: 0-7695-2081-2 (print)OAI: oai:DiVA.org:liu-23293DiVA: diva2:243607
Conference
The IEEE International Workshop on Electronic Design, Test and Applications DELTA 2004
Available from: 2009-10-07 Created: 2009-10-07 Last updated: 2013-08-16

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Publisher's full texthttp://www.ida.liu.se/labs/eslab/publications/pap/db/delta04_abdmo.pdf

Authority records BETA

Mohamed, AbdilPeng, ZeboEles, Petru Ion

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Mohamed, AbdilPeng, ZeboEles, Petru Ion
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The Institute of TechnologyESLAB - Embedded Systems Laboratory
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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf