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Test Resource Partitioning and Optimization for SOC Designs
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Computer Design and Test Lab. Nara Inst. of Science and Technology.
2003 (English)In: 2003 IEEE VLSI Test Symposium VTS03,2003, Napa Valley, USA: IEEE Computer Society Press , 2003, 319- p.Conference paper, Published paper (Refereed)
Abstract [en]

We propose a test resource partitioning and optimization technique for core-based designs. Our technique includes test set selection and test resource floor-planning with the aim of minimizing the total test application time and the routing of the added TAM (test access mechanism) wires. A feature of our approach is that it pinpoints bottlenecks that are likely to limit the test solution, which is important in the iterative test solution development process. We demonstrate the usefulness of the technique through a comparison with a test scheduling and TAM design tool.

Place, publisher, year, edition, pages
Napa Valley, USA: IEEE Computer Society Press , 2003. 319- p.
Keyword [en]
core-based design, resource floor-planning, test access mechanism, TAM, test scheduling, TAM routing
National Category
Computer Science
Identifiers
URN: urn:nbn:se:liu:diva-23335Local ID: 2766OAI: oai:DiVA.org:liu-23335DiVA: diva2:243649
Available from: 2009-10-07 Created: 2009-10-07

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http://www.ida.liu.se/labs/eslab/publications/pap/db/vts03.pdf

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Larsson, Erik

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