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Integrated Design and Test Generation Under Internet Based Environment MOSCITO
EAS Fraunhofer Institute for Integrated Circuits.
EAS Fraunhofer Institute for Integrated Circuits.
Dept. Computer Engineering Tallinn University of Technology.
Dept. Computer Engineering Tallinn University of Technology.
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2002 (English)In: EUROMICRO Symposium on Digital System Design DSD2002,2002, Dortmund, Germany: IEEE Computer Society Press , 2002, 187- p.Conference paper, Published paper (Refereed)
Abstract [en]

This paper describes an environment for internetbased collaboration in the field of design and test of digital systems. Automatic Test Pattern Generation (ATPG) and fault simulation tools at behavioral, logical and hierarchical levels available at geographically different places running under the virtual environment using the MOSCITO system are presented. The interfaces between the integrated tools and also commercial design tools were developed. The tools can be used separately, or in multiple applications in different design and test flows. The functionality of the integrated design and test system was verified in several collaborative experiments over internet by partners locating in different geographical sites.

Place, publisher, year, edition, pages
Dortmund, Germany: IEEE Computer Society Press , 2002. 187- p.
Keyword [en]
integrated testing, test generation, MOSCITO
National Category
Computer Science
Identifiers
URN: urn:nbn:se:liu:diva-23342Local ID: 2775OAI: oai:DiVA.org:liu-23342DiVA: diva2:243656
Available from: 2009-10-07 Created: 2009-10-07

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Peng, Zebo

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