Integrated Test Scheduling, Test Parallelization and TAM Design
2002 (English)In: IEEE Asian Test Symposium ATS02,2002, Tamuning, Guam, USA: IEEE Computer Society Press , 2002, 397- p.Conference paper (Refereed)
We propose a technique integrating test scheduling, scan chain partitioning and test access mechanism (TAM) design minimizing the test time and the TAM routing cost while considering test conflicts and power constraints. Main features of our technique are (1) the flexibility in modelling the systems test behaviour and (2) the support for interconnection test of unwrapped cores and user-defined logic. Experiments using our implementation on several benchmarks and industrial designs demonstrate that it produces high quality solution at low computational cost.
Place, publisher, year, edition, pages
Tamuning, Guam, USA: IEEE Computer Society Press , 2002. 397- p.
test access mechanism, TAM, TAM routing, test scheduling, scan chain partitioning, test conflicts, power constraints
IdentifiersURN: urn:nbn:se:liu:diva-23348Local ID: 2783OAI: oai:DiVA.org:liu-23348DiVA: diva2:243662