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Test Cost Minimization for Hybrid BIST
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Linköping University, The Institute of Technology. Linköping University, Department of Computer and Information Science, ESLAB - Embedded Systems Laboratory.
Dept. Computer Engineering Tallinn University of Technology.
2000 (English)In: IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems DFT2000,2000, Yamanashi, Japan: IEEE Computer Society Press , 2000, 283-291 p.Conference paper, Published paper (Refereed)
Abstract [en]

This paper describes a hybrid BIST solution for testing systems-on-chip which combines pseudorandom test patterns with stored deterministic test patterns. A method is proposed to find the optimal balance between pseudorandom and stored test patterns to perform core test with minimum time and memory, without losing test quality. Two accurate algorithms are proposed for finding the optimal time-moment to stop pseudorandom test generation and to apply stored patterns. To speed up the optimization procedure, a method is proposed for fast estimation of the expected cost for different possible solutions with very low computational cost. Experimental results have demonstrated the feasibility of the proposed approach for cost optimization of hybrid BIST.

Place, publisher, year, edition, pages
Yamanashi, Japan: IEEE Computer Society Press , 2000. 283-291 p.
Keyword [en]
hybrid BIST, testing systems-on-chip, pseudorandom test patterns, deterministic test patterns, test quality
National Category
Computer Science
Identifiers
URN: urn:nbn:se:liu:diva-23384DOI: 10.1109/DFTVS.2000.887168Local ID: 2824ISBN: 0-7695-0719-0 (print)OAI: oai:DiVA.org:liu-23384DiVA: diva2:243698
Conference
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 25-27 October 2000, Yamanashi, Japan
Available from: 2009-10-07 Created: 2009-10-07 Last updated: 2015-03-23

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Publisher's full texthttp://www.ida.liu.se/labs/eslab/publications/pap/db/DFT00.pdf

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Jervan, GertPeng, Zebo

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • oxford
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf