Residual Stress Analysis in both As-deposited and Annealed CrN Coatings
2005 (English)In: Materials Science Forum, ISSN 0255-5476, Vol. 490-491, 643-648 p.Article in journal (Refereed) Published
In this paper, we report on residual stress analysis in physical vapour deposited (PVD) CrN coatings. Two 9 µm thick coatings were grown on tool steel substrates with bias voltages of - 50 V and -300 V, respectively. High-energy (E=80 keV) synchrotron radiation measurements have been performed to investigate residual stresses in both as-deposited and annealed CrN coatings. To understand the origins of non-linear distribution of lattice strain versus sin2ψ for certain (hkl) planes in both coatings, a stress orientation distribution function (SODF) analysis has been carried out, which yields grain-orientation-dependent residual stresses. The results are compared to previous analyses using Reuss and Vook-Witt models on the as-deposited coatings.
Place, publisher, year, edition, pages
Zurich-Uetikon, Switzerland: Trans Tech Publications Inc., 2005. Vol. 490-491, 643-648 p.
Engineering and Technology
IdentifiersURN: urn:nbn:se:liu:diva-24355DOI: 10.4028/www.scientific.net/MSF.490-491.643ISI: 000230305200110Local ID: 6445OAI: oai:DiVA.org:liu-24355DiVA: diva2:244673
7th International Conference on Residual Stresses (ICRS-7) Xian, China, June 14-17, 2004