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Fast BER Test for Digital RF Transceivers
Linköping University, Department of Electrical Engineering, Electronic Devices. Linköping University, The Institute of Technology.
2009 (English)In: 14th IEEE European Test Symposium, Sevilla, Spain, May 25-29, 2009Conference paper, Published paper (Refereed)
Abstract [en]

The paper presents a fast bit-error-rate (BER) test suitable for digital receivers or transceivers. The test technique makes use of an elevated BER which can be achieved by geometrical translation of the signal constellation points on the IQ plane. As the elevated BER requires much less bits (or symbols) to be measured, significant savings in the test time can be anticipated. Also a maximum sensitivity to impairments in the noise factor is obtained in this way. To develop an effective elevated-BER test for a device in mass production a careful characterization procedure must be carried out, followed by a fine tuning procedure aimed at improving the test resolution and thereby the test coverage. The technique is supported by a simple statistical model and illustrated by a simulation example of a 4QAM receiver.

Place, publisher, year, edition, pages
2009.
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:liu:diva-25595OAI: oai:DiVA.org:liu-25595DiVA: diva2:246043
Available from: 2009-10-08 Created: 2009-10-08 Last updated: 2009-10-14Bibliographically approved

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Fast BER Test for Digital RF Transceivers(148 kB)1191 downloads
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Dabrowski, Jerzy

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
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  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
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  • asciidoc
  • rtf