Correlation between bonding structure and microstructure in fullerenelike carbon nitride thin films
2005 (English)In: Physical Review B. Condensed Matter and Materials Physics, ISSN 1098-0121, E-ISSN 1550-235X, Vol. 71, no 12, 125414- p.Article in journal (Refereed) Published
The bonding structure of highly ordered fullerenelike (FL) carbon nitride (CNx) thin films has been assessed by x-ray absorption near-edge spectroscopy (XANES). Samples with different degrees of FL character have been analyzed to discern spectral signatures related to the FL microstructure. The XANES spectra of FL-CNx films resemble that of graphitic CN x, evidencing the sp2 hybridization of both C and N atoms. The FL structure is achieved with the promotion of N in threefold positions over pyridinelike and cyanidelike bonding environments. In addition, the relative p* / σ* XANES intensity ratio at the C(1s) edge is independent of the FL character, while it decreases ∼40% at the N(1s) edge with the formation of FL arrangements. This result indicates that there is no appreciable introduction of C-sp3 hybrids with the development of FL structures and, additionally, that a different spatial localization of π electrons at C and N sites takes place in curved graphitic structures. The latter has implications for the elastic properties of graphene sheets and could, as such, explain the outstanding elastic properties of FL-CNx.
Place, publisher, year, edition, pages
2005. Vol. 71, no 12, 125414- p.
National CategoryNatural Sciences
IdentifiersURN: urn:nbn:se:liu:diva-28408DOI: 10.1103/PhysRevB.71.125414Local ID: 13544OAI: oai:DiVA.org:liu-28408DiVA: diva2:249214