Test Generation: A Hierarchical Approach
2005 (English)In: System-level Test and Validation of Hardware/Software Systems / [ed] M. Sonza Reorda, Z. Peng, M. Violante, Berlin: Springer Berlin Heidelberg , 2005, 67-81 p.Chapter in book (Other academic)
New manufacturing technologies have made possible the integration of entire systems on a single chip. This new design paradigm, termed system-on-chip (SOC), together with its associated manufacturing problems, represents a real challenge for designers. SOC is also reshaping approaches to test and validation activities. These are beginning to migrate from the traditional register-transfer or gate levels of abstraction to the system level. Until now, test and validation have not been supported by system-level design tools so designers have lacked the infrastructure to exploit all the benefits stemming from the adoption of the system level of abstraction. Research efforts are already addressing this issue. This monograph provides a state-of-the-art overview of the current validation and test techniques by covering all aspects of the subject including: modeling of bugs and defects; stimulus generation for validation and test purposes (including timing errors; design for testability.
Place, publisher, year, edition, pages
Berlin: Springer Berlin Heidelberg , 2005. 67-81 p.
, Springer Series in Advanced Microelectronics, 17
testing, hierachical testing
IdentifiersURN: urn:nbn:se:liu:diva-28501Local ID: 13650ISBN: 1-85233-899-7ISBN: 978-1-84628-145-7OAI: oai:DiVA.org:liu-28501DiVA: diva2:249311