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X-Ray Diffraction Analysis of Epigrowth on Porous SiC Substrates
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2005 (English)In: Materials Science Forum, Vols. 483-485, 2005, Vol. 483-485, 265-268 p.Conference paper (Refereed)
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2005. Vol. 483-485, 265-268 p.
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Natural Sciences
URN: urn:nbn:se:liu:diva-30733Local ID: 16347OAI: diva2:251556
Available from: 2009-10-09 Created: 2009-10-09 Last updated: 2010-12-08

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Syväjärvi, MikaelYakimova, Rositsa
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Department of Physics, Chemistry and BiologyThe Institute of TechnologySemiconductor Materials
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