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Structural and optical characterization of wurtzite Al0.8In0.2N thin films grown by low temperature magnetron sputter epitaxy
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology.
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology.ORCID iD: 0000-0002-2837-3656
Linköping University, Department of Physics, Chemistry and Biology, Thin Film Physics. Linköping University, The Institute of Technology.
2006 (English)In: Gallium Nitride Materials and Devices,2006, Bellingham: SPIE, International Society for Optical Engineering , 2006, 61210C- p.Conference paper, Published paper (Refereed)
Place, publisher, year, edition, pages
Bellingham: SPIE, International Society for Optical Engineering , 2006. 61210C- p.
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Natural Sciences
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URN: urn:nbn:se:liu:diva-34456Local ID: 21492OAI: oai:DiVA.org:liu-34456DiVA: diva2:255304
Available from: 2009-10-10 Created: 2009-10-10 Last updated: 2016-08-31

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Seppänen, TimoHultman, LarsBirch, Jens

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